Optical Metrology
Seiten
2002
|
3rd edition
John Wiley & Sons Inc (Verlag)
978-0-470-84300-0 (ISBN)
John Wiley & Sons Inc (Verlag)
978-0-470-84300-0 (ISBN)
Presents a material on computerized optical processes, computerized ray tracing, and the Fourier transform, Bibre-Bragg sensors, and temporal phase unwrapping. This book provides discussion on lasers and laser principles, including an introduction to radiometry and photometry. It offers coverage of the CCD camera.
New material on computerized optical processes, computerized ray tracing, and the fast Fourier transform, Bibre-Bragg sensors, and temporal phase unwrapping.
* New introductory sections to all chapters.
* Detailed discussion on lasers and laser principles, including an introduction to radiometry and photometry.
* Thorough coverage of the CCD camera.
New material on computerized optical processes, computerized ray tracing, and the fast Fourier transform, Bibre-Bragg sensors, and temporal phase unwrapping.
* New introductory sections to all chapters.
* Detailed discussion on lasers and laser principles, including an introduction to radiometry and photometry.
* Thorough coverage of the CCD camera.
Kjell J. Gåsvik is the author of Optical Metrology, 3rd Edition, published by Wiley.
Preface to the Third Edition
Basics
Gaussian Optics
Interference
Diffraction
Light Sources and Detectors
Holography
Moire Methods, Triangulation
Speckle Methods
Photoelasticity and Polarized Light
Digital Image Processing
Fringe Analysis
Computerized Optical Processes
Fibre Optics Metrology
Appendix: Complex Numbers
Appendix: Fourier Optics
Appendix Fourier Series
Appendix The Least Squares Error Method
Appendix Semiconductor Devices
Erscheint lt. Verlag | 29.8.2002 |
---|---|
Verlagsort | New York |
Sprache | englisch |
Maße | 176 x 249 mm |
Gewicht | 851 g |
Themenwelt | Naturwissenschaften ► Physik / Astronomie ► Optik |
Technik ► Elektrotechnik / Energietechnik | |
ISBN-10 | 0-470-84300-4 / 0470843004 |
ISBN-13 | 978-0-470-84300-0 / 9780470843000 |
Zustand | Neuware |
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