O. Ostroverkhova,     Oregon State University, USA. E-mail address: oksana@science.oregonstate.edu

Y. Shirota*,     Department of Environmental and Biological Chemistry, Fukui University of Technology, 3-6-1 Gakuen, Fukui City, Fukui 910-0850, Japan. E-mail address: shirota@fukui-ut.ac.jp, shirota@chem.eng.osaka-u.ac.jp

H. Kageyama,     Department of Electrical and Electronics Engineering, Faculty of Engineering, University of the Ryukyus, 1 Senbaru, Nishihara, Okinawa 903-0213, Japan

S.R. Puniredd, W. Pisula* and K. Müllen,     Max Planck Institute for Polymer Research, Ackermannweg 10, 55124 Mainz, Germany. E-mail address: pisula@mpip-mainz.mpg.de, muellen@mpip-mainz.mpg.de

K. Leo* and M. Hummert,     Institut für Angewandte Photophysik, Technische Universität Dresden, George-Bähr-Straße 1, 01062 Dresden, Germany. E-mail address: leo@iapp.de

H. Kishida*,     Department of Applied Physics, Nagoya University, Furo-cho, Chikusa-ku, Nagoya 464-8603, Japan. E-mail address: kishida@nuap.nagoya-u.ac.jp

T. Yamamoto,     Chemical Resources Laboratory, Tokyo Institute of Technology, 4259 Nagatsuta, Midori-ku, Yokohama 226-8503, Japan. E-mail address: tyamamot@res.titech.ac.jp

I. Biaggio,     Department of Physics, Lehigh University, 16 Memorial Drive East, Bethlehem, PA 18015, USA. E-mail address: biaggio@lehigh.edu

M. Jazbinsek* and P. Günter

Nonlinear Optics Laboratory, ETH Zurich, Switzerland

Rainbow Photonics AG, Farbhofstrasse 21, CH-8048 Zurich, Switzerland. Email: mojca@rainbowphotonics.com, gunter@phys.ethz.ch.

J.C. Sancho-Garcia,     Departamento de Quimica-Fisica, Universidad de Alicante, E-03080 Alicante, Spain. E-mail address: jc.sancho@ua.es

J. Godlewski* and M. Obarowska,     Gdansk University of Technology, G. Narutowicza 11/12, 80-233 Gdansk, Poland. E-mail address: jago@mif.pg.gda.pl

J. Perez-Moreno

Department of Physics, Skidmore College, 815 North Broadway, Saratoga Springs, NY 12866, USA and Department of Physics and Astronomy Washington State University Pullman, WA 99164-2814 USA

Department of Physics and Astronomy, Washington State University, Pullman, WA 99164-2814, USA. Email: jperezmo@skidmore.edu, xpmworks@gmail.com.

Z.V. Vardeny*,     Department of Physics and Astronomy, University of Utah, Salt Lake City, UT 84112, USA. E-mail address: val@physics.utah.edu

C.-X. Sheng,     School of Electronic and Optical Engineering, Nanjing University of Science and Technology, Nanjing, Jiangsu, 210094, China

H. Diesinger, E.A. Chan, J. Yin and C. Soci*,     Centre for Disruptive Photonic, Technologies and Division of Physics and Applied Physics, 21 Nanyang Link, Nanyang Technological University, Singapore, 637371. E-mail address: csoci@ntu.edu.sg

O.D. Jurchescu,     Wake Forest University, Department of Physics, 1834 Wake Forest Road, Winston-Salem, NC 27109-7507, USA. E-mail address: oana@wfu.edu

A. Pivrikas,     School of Chemistry and Molecular Biosciences, Centre for Organic Photonics and Electronics (COPE), The University of Queensland Brisbane, Australia. E-mail address: almantas.pivrikas@uq.edu.au

K. Willets*,     The University of Texas at Austin Department of Chemistry, Welch Hall 2.204, 105 E. 24th St. Stop A5300, Austin, TX 78712-1224, USA

K. Mayer,     Tufts University, Department of Chemistry, 62 Talbot Avenue, Medford, MA 02155, USA. E-mail address: kwillets@cm.utexas.edu

K.D. Singer and Y. Wu*,     Case Western Reserve University, Department of Physics, Cleveland, OH 44106-7079, USA. E-mail address: kds4@cwru.edu

M. Hösel, D. Angmo and F.C. Krebs*,     Technical University of Denmark, Department of Energy Conversion and Storage, Frederiksborgvej 399, Roskilde, DK-4000, Denmark. E-mail address: frkr@dtu.dk

T. Schwab*, B. Lüssem, M. Furno, M.C. Gather and K. Leo,     Institut für Angewandte Photophysik, TU Dresden, 01069 Dresden, Germany. E-mail address: tobias.schwab@iapp.de, leo@iapp.de

Z.V. Vardeny* and T.D. Nguyen,     Physics and Astronomy Department, University of Utah, Salt Lake City, UT 84112, USA. E-mail address: val@physics.utah.edu

E. Ehrenfreund,     Physics Department, Technion–Israel Institute of Technology, Haifa 32000, Israel

H.E. Katz* and T.J. Dawidczyk,     Department of Materials Science and Engineering, Johns Hopkins University, 206 Maryland Hall, 3400 North Charles Street, Baltimore, MD 21218, USA. E-mail address: hekatz@jhu.edu

H. Kong,     Korea Research Institute of Chemical Technology (KRICT), Research Center for Green Fine Chemicals 895-4, Yugok-dong, Jung-gu, Ulsan, 681-310, Republic of Korea. E-mail address: hkong2@krict.re.kr, lovealkein@gmail.com

G. Tarabella, N. Coppedè and S. Iannotta,     IMEM-CNR, Institute of Materials for Electronics and Magnetism, Viale Usberti 37/A, Parco Area delle Scienze, 43100, Parma, Italy

F. Cicoira*, P. Kumar and C. Santato,     Département de Génie Chimique, École Polytechnique de Montréal, 2500 chemin de Polytechnique, Montréal, Québec, H3T 1J4, Canada. E-mail address: fabio.cicoira@polymtl.ca

M.C. Petty,     School of Engineering and Computing Sciences and Centre for Molecular and Nanoscale Electronics, Durham University, Durham DH1 3LE, UK. E-mail address: m.c.petty@durham.ac.uk

M. Oszajca*,     Jagiellonian University, Faculty of Chemistry, ul. Ingardena 3, 30-060 Kraków, Poland

A. Podborska,     AGH University of Science and Technology, Faculty of Non-Ferrous Metals, al. Mickiewicza 30, 30-059 Kraków, Poland

K. Szaciłowski

Jagiellonian University, Faculty of Chemistry, ul. Ingardena 3, 30-060 Kraków, Poland

AGH University of Science and Technology, Faculty of Non-Ferrous...