Fundamentals of Energy Dispersive X-Ray Analysis -  John C. Russ

Fundamentals of Energy Dispersive X-Ray Analysis (eBook)

Butterworths Monographs in Materials
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2013 | 1. Auflage
314 Seiten
Elsevier Science (Verlag)
978-1-4831-6400-7 (ISBN)
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Fundamentals of Energy Dispersive X-ray Analysis provides an introduction to the fundamental principles of dispersive X-ray analysis. It presents descriptions, equations, and graphs to enable the users of these techniques to develop an intuitive and conceptual image of the physical processes involved in the generation and detection of X-rays.

The book begins with a discussion of X-ray detection and measurement, which is accomplished by one of two types of X-ray spectrometer: energy dispersive or wavelength dispersive. The emphasis is on energy dispersive spectrometers, given their rather widespread use compared to the wavelength dispersive type. This is followed by separate chapters on techniques such as X-ray absorption; spectrum processing; and elimination of spectrum background produced by electron excitation. Subsequent chapters cover X-ray fluorescence; the use of regression models; hardware for X-ray fluorescence analysis; scattering, background, and trace element analysis; and methods for producing inner shell excitation of atoms in a sample of interest. The final chapter deals with applications of X-ray analysis.
Fundamentals of Energy Dispersive X-ray Analysis provides an introduction to the fundamental principles of dispersive X-ray analysis. It presents descriptions, equations, and graphs to enable the users of these techniques to develop an intuitive and conceptual image of the physical processes involved in the generation and detection of X-rays. The book begins with a discussion of X-ray detection and measurement, which is accomplished by one of two types of X-ray spectrometer: energy dispersive or wavelength dispersive. The emphasis is on energy dispersive spectrometers, given their rather widespread use compared to the wavelength dispersive type. This is followed by separate chapters on techniques such as X-ray absorption; spectrum processing; and elimination of spectrum background produced by electron excitation. Subsequent chapters cover X-ray fluorescence; the use of regression models; hardware for X-ray fluorescence analysis; scattering, background, and trace element analysis; and methods for producing inner shell excitation of atoms in a sample of interest. The final chapter deals with applications of X-ray analysis.

Front Cover 1
Fundamentals of Energy Dispersive X-Ray Analysis 4
Copyright Page 5
Table of Contents 6
Chapter 1. X-Ray Emission 8
Chapter 2. Wavelength Dispersive Spectrometers 17
Bragg Diffraction 17
Spectrometer Mechanisms 18
Crystals 20
Proportional Counters 20
Summary of Characteristics 23
Chapter 3. Energy Dispersive Spectrometers 24
History 24
Principles of Operation 25
Preamplification 27
Pulse Processing 28
Counting Time Corrections 30
Resolution 34
Spectral Artefacts 35
Qualitative Analysis with ED Systems 44
Chapter 4. Electron Penetration in Solids 49
Electron Backscattering 56
Chapter 5. Monte-Carlo Modelling 64
Typical Results 67
The Problem with Monte-Carlo 74
Chapter 6. X-Ray Absorption 76
Chapter 7. Secondary Fluorescence 88
Chapter 8. Applying the Corrections(Quantitative Analysis) 98
Chapter 9. Standards:Real, Complex and Imaginary 107
Compound Standards 110
Interpolating 111
Calculating Pure Intensities 113
Spectrometer Efficiency 117
Using Theoretical Intensities 120
No Standards at All 122
Chapter 10. Accuracy and Errors 124
Counting Statistics 125
Spectrum Processing 126
Correction Models 129
Standards 131
Conclusions 135
Chapter 11. Spectrum Processing 137
Smoothing 137
Background Removal 139
Computing the Background 140
Frequency Filtering 141
Digital Filters for Differentiation 143
Peak Deconvolution 145
Generating Peak Profiles 148
Calibration Shifts 152
Overlap Factors 155
Chapter 12. Background in Electron Excited Spectra 158
Other Considerations 164
Peak to Background Models 167
Chapter 13. Thin Sections in STEM and TEM 171
Peak to Background 171
Elemental Ratios 174
Standards 175
Other Considerations 178
Chapter 14. Ultra - Low Energies 181
"Windowless" ED detectors 181
Excitation of Low Z Elements 185
Data Interpretation 186
Chapter 15. X-ray Distribution Maps 188
Ratemeters 194
Problems with Surface Topography 197
Chapter 16. Heterogeneous Samples 199
Chapter 17. Less Common Methods 207
Handling Non-standard Situations 208
Chapter 18. X-ray Fluorescence - Fundamentals 215
Photon Excitation - X-ray Tubes 215
Absorption of the Generating X-rays 217
The Effective Wavelength Model 223
Chapter 19. Regression Models 227
Influence Coefficient Models 229
Other Forms and Models 231
Examples of Calibration Curves 234
Chapter 20. Hardware for XRF 236
Energy Dispersive XRF 238
Qualitative Analysis 239
Chapter 21. Sample Effects 244
Depth of Analysis 247
Analysis of layered structures 250
Filter Paper Samples 251
Chapter 22. Scattering, Background and Trace Element Analysis 254
Quantification at Low Levels 259
Chapter 23. Modifying the Excitation Function 266
Secondary Targets 266
Radioactive Sources 272
Filters 274
Polarized X-rays 279
Chapter 24. Other Ways to Excite the Sample 282
Proton Induced X-ray Emission (PIXE) 282
Alpha Particle Excitation 285
Chapter 25. Sorting, Tagging, and Matching 288
Tagging 289
Alloy Sorting 292
Matching Stored Spectra 296
Chapter 26. Conclusions 298
Sample Preparation 299
References 302
Index 312

Erscheint lt. Verlag 22.10.2013
Sprache englisch
Themenwelt Naturwissenschaften Chemie
Naturwissenschaften Physik / Astronomie Elektrodynamik
Technik
ISBN-10 1-4831-6400-4 / 1483164004
ISBN-13 978-1-4831-6400-7 / 9781483164007
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