Handbook of X-Ray Spectrometry
Seiten
2001
|
2nd edition
Crc Press Inc (Verlag)
978-0-8247-0600-5 (ISBN)
Crc Press Inc (Verlag)
978-0-8247-0600-5 (ISBN)
"Updates fundamentals and applications of all modes of x-ray spectrometry, including total reflection and polarized beam x-ray fluorescence analysis, and synchrotron radiation induced x-ray emission. Promotes the accurate measurement of samples while reducing the scattered background in the x-ray spectrum."
Rene van GriekenAndrzej Markowicz
X-ray physics; wavelength-dispersive X-ray fluorescence; energy-dispersive x-ray flourescences; data analysis; quantification in XRF analysis of infinitely thick samples; quantification in XRF analysis of intermediate-thickness samples; radioisotope X-ray analysis; synchrotron radiation X-ray emission; total-reflection XRF; polarized beam XRF; capillary beam XRF or X-ray micro-flourescence; particle-induced X-ray emission; electron-induced X-ray emission; sample preparation for XRF.
Erscheint lt. Verlag | 27.11.2001 |
---|---|
Reihe/Serie | Practical Spectroscopy |
Verlagsort | Bosa Roca |
Sprache | englisch |
Maße | 210 x 280 mm |
Gewicht | 1814 g |
Themenwelt | Naturwissenschaften ► Chemie ► Analytische Chemie |
ISBN-10 | 0-8247-0600-5 / 0824706005 |
ISBN-13 | 978-0-8247-0600-5 / 9780824706005 |
Zustand | Neuware |
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