Intrinsic Point Defects, Impurities, and Their Diffusion in Silicon - Peter Pichler

Intrinsic Point Defects, Impurities, and Their Diffusion in Silicon

(Autor)

Buch | Softcover
XXI, 554 Seiten
2012 | 1. Softcover reprint of the original 1st ed. 2004
Springer Wien (Verlag)
978-3-7091-7204-9 (ISBN)
320,99 inkl. MwSt
Basically all properties of semiconductor devices are influenced by the distribution of point defects in their active areas. This book contains the first comprehensive review of the properties of intrinsic point defects, acceptor and donor impurities, isovalent atoms, chalcogens, and halogens in silicon, as well as of their complexes. Special emphasis is placed on compiling the structures, energetic properties, identified electrical levels and spectroscopic signatures, and the diffusion behavior from experimental and theoretical investigations. In addition, the book discusses the fundamental concepts of silicon and its defects, the electron system, diffusion, thermodynamics, and reaction kinetics which form the scientific basis needed for a thorough understanding of the text. Therefore, the book is able to provide an introduction to newcomers in this field up to a comprehensive reference for experts in process technology, solid-state physics, and simulation of semiconductor processes.

Peter Pichler, Dr., geb. 1980, Studium der Geschichte, Philosophie und Medien in Graz und Mainz. Lektor am Institut für Geschichte der Karl-Franzens-Universität Graz, seit 2004 Mitarbeiter am Institut für Österreichische Rechtsgeschichte und Europäische Rechtsentwicklung ebenda. Veröffentlichungen zur Geschichte der europäischen Integration, zur Geschichte der europäischen Identität sowie zur österreichischen Geschichte.

Fundamental Concepts.- 1.1 Silicon and Its Imperfections.- 1.2 The Electron System.- 1.3 Phenomenological and Atomistic Approaches to Diffusion.- 1.4 Thermodynamics.- 1.5 Reaction Kinetics.- 1.6 Exchange of Matter Between Phases.- 2 Intrinsic Point Defects.- 2.1 Concentration in Thermal Equilibrium.- 2.2 Diffusion of Intrinsic Point Defects.- 2.3 Self-Diffusion and Tracer Diffusion.- 2.4 Vacancies.- 2.5 Self-Interstitials.- 2.6 Frenkel Pairs.- 2.7 Bulk Recombination and Bulk Processes.- 2.8 Surface Recombination and Surface Processes.- 2.9 Initial Conditions.- 3 Impurity Diffusion in Silicon.- 3.1 Basic Mechanisms.- 3.2 Impurity-Point-Defect Pairs.- 3.3 Diffusion of Substitutional Impurities via Mobile Complexes with Intrinsic Point Defects.- 3.4 Pair-Diffusion Models.- 3.5 Frank-Turnbull Mechanism.- 3.6 Kick-Out Mechanism.- 4 Isovalent Impurities.- 4.1 Carbon.- 4.2 Germanium.- 4.3 Tin.- 5 Dopants.- 5.1 Dopant Clusters.- 5.2 Ion Pairing.- 5.3 Boron.- 5.4 Aluminum.- 5.5 Gallium.- 5.6 Indium.- 5.7 Nitrogen.- 5.8 Phosphorus.- 5.9 Arsenic.- 5.10 Antimony.- 6 Chalcogens.- 6.1 Oxygen.- 6.2 Sulfur.- 6.3 Selenium.- 6.4 Tellurium.- 7 Halogens.- 7.1 Fluorine.- 7.2 Chlorine.- 7.3 Bromine.- List of Tables.- List of Figures.

Erscheint lt. Verlag 1.11.2012
Reihe/Serie Computational Microelectronics
Zusatzinfo XXI, 554 p. 40 illus.
Verlagsort Vienna
Sprache englisch
Maße 178 x 254 mm
Gewicht 1022 g
Themenwelt Naturwissenschaften Chemie Analytische Chemie
Technik Elektrotechnik / Energietechnik
Schlagworte acceptor and donor impurities • chalcogens • halogens • isovalent atoms • semiconductor • Semiconductor Devices • Simulation • Tables • thermodynamics
ISBN-10 3-7091-7204-7 / 3709172047
ISBN-13 978-3-7091-7204-9 / 9783709172049
Zustand Neuware
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