Atomic Force Microscopy/Scanning Tunneling Microscopy 3

A Prectical Approach to Understanding Surface Metrology and Its Applications.- Applications of Scanning Probe Microscopy in Materiias Science: Examples of Surface Modification and Quantitative Analysis.- Scanning Probe Microscopy in Biology with Potential Applications in Forensics.- Atomic Manipulation of Hydrogen on Hydrogen-Terminated Silicon Surfaces with Scanning Tunneling Microscope.- Apollo 11 Lunar Samples: an Examination Using Tapping Mode Atomic Force Microscopy and Other Microscopic Methods.- Novel Micromachined Cantilever Sensors for Scanning Near-Field Microscopy.- Imaging of Cell Surfaca Structure by Scanning Probe Microscopy.- A Force Limitation for Successful Observation of Atomic Defects: Defect Trappong of the Atomic Force Microscopy Tip.- A New Approach to Examine Interfacial Interaction Potential between a Thin Solid Film or a Droplet and a Smooth Substrate.- Nanometer-Scale Patterning of Surfaces Using Self-Assembly Chemistry. 1. Preliminary Studies of Polyaniline Electrodeposition on Self-Assembled Mixed Monolayers.- Local Rate of Electroless Copper Deposition By Scanning Tunneling Microscopy.- Atomic Force Microscopy of Olivine.- The Study of Sublimation Rates and Nucleation and Growth of TNT and Petn on Slica and Graphite Surfaces by Optical and Atomic Force Microscopy and Ellipsometry.- Peculiarities of the Scanning Tunneling Microscopy Probe on Porous Gallium Phosphide.- Influence of Doping Concentration on the Etching Rate of GaAs Studied by Atomic Force Microscopy.- Comparative Scanning Tunneling Microscopy Studies of CoFe2O4 Nanporaticles of Ferrofluids in Acidic Medium.- From Laboratory Measurements to the First In-Situ Analysis of Pristine Cometary Grains.- Synthesis of Pprbiotic Peptides and Oligonucleotides on Clay Mineral Surfaces: A Scanning Force Michoscopy Study.- Surface Structure and Intercalative Polymerization Studies of Smectite Clay Thin Films.- Atomic Force Microscopy—A New and Complementary Tool in Asphalt Research Compared to Scanning Electron Microscopy.