Critical Phenomena at Surfaces and Interfaces - Helmut Dosch

Critical Phenomena at Surfaces and Interfaces

Evanescent X-Ray and Neutron Scattering

(Autor)

Buch | Softcover
X, 149 Seiten
2013 | 1. Softcover reprint of the original 1st ed. 1992
Springer Berlin (Verlag)
978-3-662-14975-1 (ISBN)
53,49 inkl. MwSt
This book deals with the application of grazing angle x-rayand neutron scattering to the study of surface-inducedcritical phenomena. With the advent of even more advancedsynchrotron radiation sources and new sophisticatedinstrumentation this novel technique is expected toexperience a boom.The comprehensive and detailed presentation of theoreticaland experimental aspects of the scattering of evanascentx-ray and neutron waves inside a solid makes this bookparticularly useful for tutorial courses.Particular emphasis is put on the use of this technique toextract microscopic information (correlation functions) fromthe real structure of a surface, from buried and magneticinterfaces and from surface roughness.

Evanescent X-ray scattering.- Evanescent neutron scattering.- Semi-infinite critical systems.- Surface effects at first order phase transitions.

Erscheint lt. Verlag 3.10.2013
Reihe/Serie Springer Tracts in Modern Physics
Zusatzinfo X, 149 p. 31 illus.
Verlagsort Berlin
Sprache englisch
Maße 155 x 235 mm
Gewicht 254 g
Themenwelt Naturwissenschaften Physik / Astronomie Optik
Technik Elektrotechnik / Energietechnik
Schlagworte diffraction • oberflächeninduzierte kritische Phänomene • Phasenübergänge • phase transitions • Röntgenstrahlung und Neutronenstreuung • scattering • specular reflection • Streuung • Surface • surface-induced critical phenomea • Synchrotron radiation • X-Ray • x-ray and neutron scattering
ISBN-10 3-662-14975-3 / 3662149753
ISBN-13 978-3-662-14975-1 / 9783662149751
Zustand Neuware
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