Toward Quantum FinFET

Weihua Han, Zhiming M. Wang (Herausgeber)

Buch | Hardcover
XI, 363 Seiten
2013 | 2013
Springer International Publishing (Verlag)
978-3-319-02020-4 (ISBN)

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This book reviews a range of quantum phenomena in novel nanoscale transistors called FinFETs, including quantized conductance of 1D transport, single electron effect, and tunneling transport.
This book reviews a range of quantum phenomena in novel nanoscale transistors called FinFETs, including quantized conductance of 1D transport, single electron effect, and tunneling transport.

Preface
Chapter 1: Simulation of Quantum Ballistic Transport in FinFETs
Chapter 2: Model for quantum confinement in nanowires and the application of this model to the study of carrier mobility in nanowire FinFETs
Chapter 3: Understanding the FinFET Mobility by Systematic Experiments
Chapter 4: Quantum Mechanical Potential Modeling of FinFET
Chapter 5: Physical insight and correlation analysis of finshape fluctuations and work-function variability in FinFET devices
Chapter 6: Characteristic and Fluctuation of Multi-Fin FinFETs
Chapter 7: Variability in Nanoscale FinFET Technologies
Chapter 8: Random Telegraph Noise in Multi-Gate FinFET/Nanowire Devices and the Impact of Quantum Confinement
Chapter 9: Investigations on Transport Properties of Poly-Silicon Nanowire Transistors Featuring Independent Double-Gated Configuration under Cryogenic Ambient
Chapter 10: Towards Drain extended FinFETs for SoC applications
Chapter 11: Modeling FinFETs for CMOS Applications
Chapter 12: Enhanced Quantum Effects in Room-Temperature Coulomb Blockade Devices Based on Ultrascaled finFET Structure
Chapter 13: Single-Electron Tunneling Transistors Utilizing Individual Dopant Potentials
Chapter 14: Single Electron Transistor and Quantum Dots on Graphene
Chapter 15: Terahertz Response in Schottky Warp-Gate Controlled Single Electron Transistors
Index

Erscheint lt. Verlag 13.12.2013
Reihe/Serie Lecture Notes in Nanoscale Science and Technology
Zusatzinfo XI, 363 p. 235 illus., 168 illus. in color.
Verlagsort Cham
Sprache englisch
Maße 155 x 235 mm
Gewicht 724 g
Themenwelt Naturwissenschaften Physik / Astronomie Atom- / Kern- / Molekularphysik
Naturwissenschaften Physik / Astronomie Festkörperphysik
Technik Elektrotechnik / Energietechnik
Schlagworte CMOS-compatibility • FinFET • FinFET Quantum Mechanical Potential Modelling • FinFET Quantum Phenomena • FinFET Quantum Transport Simulation • FinFETs, Electrical Transport • FinFET Technologies, Device Variability • Fin Shape Fluctuation, FinFETs • Funneling Transport • Gate-all-around Nanowire MOSFETs • Highly Scaled SiGe/Si Core/Shell Nanowire • High Voltage FinFETs for SoC Applications • MOSFET • MOSFET (MOS-Feldeffekt-Transistor) • Mulgi-gate FinFET • Nanofabrication • Nonplanar FinFet • Novel Nanoscale Transistors for Semiconductors • Quantized Conductance 1D Transport • quantum confinement • Quantum Confinement Effect of FinFET • Quantum Dots on Graphene • Quantum FinFET and Nanotechnology • Quantum FinFET Electronics • Quantum Transport • Schottky Warp-Gate Controlled Single Electron Tran • Schottky Warp-Gate Controlled Single Electron Transistor • Silicon Nanowire • Single Electron Effect • Single Electron Transistor, Graphene • Work-function Variability, FinFETs
ISBN-10 3-319-02020-X / 331902020X
ISBN-13 978-3-319-02020-4 / 9783319020204
Zustand Neuware
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