Broadband Reflectometry for Enhanced Diagnostics and Monitoring Applications - Andrea Cataldo, Egidio De Benedetto, Giuseppe Cannazza

Broadband Reflectometry for Enhanced Diagnostics and Monitoring Applications

Buch | Softcover
XVIII, 150 Seiten
2013 | 2011
Springer Berlin (Verlag)
978-3-642-26797-0 (ISBN)
119,99 inkl. MwSt
This book examines the adoption of broadband microwave reflectometry (BMR)-based methods for diagnostics and monitoring applications. It details the different approaches of BMR and investigates major practical applications.

This book is dedicated to the adoption of broadband microwave reflectometry (BMR)-based methods for diagnostics and monitoring applications. This electromagnetic technique has established as a powerful tool for monitoring purposes; in fact, it can balance several contrasting requirements, such as the versatility of the system, low implementation cost, real-time response, possibility of remote control, reliability, and adequate measurement accuracy.

Starting from an extensive survey of the state of the art and from a clear and concise overview of the theoretical background, throughout the book, the different approaches of BMR are considered (i.e., time domain reflectometry - TDR, frequency domain reflectometry - FDR, and the TDR/FDR combined approach) and several applications are thoroughly investigated.

The applications considered herein are very diverse from each other and cover different fields. In all the described procedures and methods, the ultimate goal is to endow them with a significant performance enhancement in terms of measurement accuracy, low cost, versatility, and practical implementation possibility, so as to unlock the strong potential of BMR.

Introduction.- Basic Physical Principles.- Broadband Reflectometry: Theoretical Background.- Quantitative and Qualitative Characterization of Liquid Materials.- Qualitative Characterization of Granular Materials and Moisture.- Measurements .- BMR Characterization of Antennas Through the Combined TD/FD.- Approach.

Erscheint lt. Verlag 29.5.2013
Reihe/Serie Lecture Notes in Electrical Engineering
Zusatzinfo XVIII, 150 p.
Verlagsort Berlin
Sprache englisch
Maße 155 x 235 mm
Gewicht 266 g
Themenwelt Naturwissenschaften Physik / Astronomie Optik
Technik Elektrotechnik / Energietechnik
Schlagworte Broadband Reflectometry • Diagnostics • Microwave Reflectometry • Monitoring
ISBN-10 3-642-26797-1 / 3642267971
ISBN-13 978-3-642-26797-0 / 9783642267970
Zustand Neuware
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