Strain And Dislocation Gradients From Diffraction: Spatially-resolved Local Structure And Defects
Imperial College Press (Verlag)
978-1-908979-62-9 (ISBN)
Diffraction Analysis of Defects - State of the Art; X-Ray Laue Diffraction Microscopy in 3D at the Advanced Photon Source; High Energy Transmission Laue Micro-Beam Diffraction; XMAS: A Versatile Tool for Analyzing Synchrotron X-Ray Microdiffraction Data; Laue Microdiffraction at ESRF; 3D X-Ray Diffraction Microscopy; Grain Centre Mapping - 3DXRD Measurements of Average Grain Characteristics; Three Dimensional X-Ray Diffraction Imaging Techniques; High Resolution Reciprocal Space Mapping for Characterizing Deformation Structures; Reconstructing 2D & 3D Orientation Maps from White Beam Laue; Energy-Variable X-Ray Diffraction for Studying Polycrystalline Materials with High Depth Resolution; Microstructure Detail Extraction via EBSD: An Overview; High Pressure Studies with Microdiffraction.
Erscheint lt. Verlag | 20.5.2014 |
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Verlagsort | London |
Sprache | englisch |
Themenwelt | Naturwissenschaften ► Physik / Astronomie ► Mechanik |
ISBN-10 | 1-908979-62-3 / 1908979623 |
ISBN-13 | 978-1-908979-62-9 / 9781908979629 |
Zustand | Neuware |
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