Atomic, Molecular, and Optical Physics: Charged Particles (eBook)

Front Cover 1
Atomic, Molecular, and Optical Physics: Charged Particles 4
Copyright Page 5
Contents 6
Contributors 14
Preface 16
List of Volumes in Treatise 18
Chapter 1. Spin-Polarized Electron Sources 22
1.1. Introduction 22
1.2. Background 24
1.3. The Photocathode 32
1.4. Incident Radiation 43
1.5. Operation of the Photocathode in an Electron Gun 45
1.6. Summary 51
Appendix A: Cleaning GaAs 54
Appendix B: Anodization of GaAs 55
References 56
Chapter 2. Positron and Positronium Sources 60
2.1. Introduction 60
2.2. Positron Sources 60
2.3. Moderation 67
2.4. Transport, Lenses, and Mirrors 71
2.5. Remoderation 72
2.6. Trapping and Bunching 74
2.7. Positronium Formation 76
2.8. Summary and Conclusion 83
References 83
Chapter 3. Sources of Low-Charge-State Positive-Ion Beams 90
3.1. Introduction 90
3.2. Arc Plasma Discharge Ion Sources 95
3.3. Radiofrequency (RF) Discharge Ion Sources 137
3.4. Electron-Cyclotron Resonance and Microwave Ion Sources 144
3.5. Vacuum-Arc Ion Sources 150
3.6. Sources Based on Field Ionization and Field Evaporation 155
3.7. Surface Ionization and Thermal Emitter Ion Sources 168
3.8. Thermal Ionization Sources 180
References 183
Chapter 4. Advanced Sources of Highly Charged Ions 190
4.1. Introduction 190
4.2. The Electron-Beam Ion Source 193
4.3. The Electron–Cyclotron Resonance Ion Source 198
4.4. Other Techniques 206
References 208
Chapter 5. Electron and Ion Optics 210
5.1. Introduction 210
5.2. Collimation and Definition of a Charged Particle Beam 212
5.3. Electrostatic Lenses 214
5.4. Designing Electrostatic Lens Systems 222
5.5. Computer Simulation Programs 225
References 228
Chapter 6. Electron Energy Analyzers 230
6.1. Introduction 230
6.2. Electron Energy Analyzing Systems 230
6.3. Trajectories and Focusing in Dispersive Deflection Analyzers 236
6.4. Fringing Fields, Terminations, and Guard Rings 241
6.5. Input Lenses and Operating Modes 242
6.6. Multichannel Energy Detection and Imaging 247
6.7. Construction Hints and Practical Details 248
References 249
Chapter 7. Electron Polarimetry 252
7.1. Introduction 252
7.2. Electron Polarimeters 255
7.3. Calibration Methods 264
7.4. Systematic Errors 266
7.5. Comparison of Polarimeters 268
References 271
Chapter 8. Position Sensitive Particle Detection with Microchannel-Plate Electron Multipliers 274
8.1. Microchannel Plates 274
8.2. Position-Sensitive Readout Systems 280
8.3. Conclusion 291
References 291
Chapter 9. Swarm Techniques 294
9.1. Introduction 294
9.2. Afterglow Plasma Techniques 297
9.3. The Selected Ion Flow Tube Technique 306
9.4. Drift Tube Techniques 311
9.5. Swarm Experiments at Very Low Temperatures: The CRESU Technique 314
9.6. Concluding Remarks 316
References 316
Chapter 10. Accelerator-Based Atomic Physics 320
10.1. Introduction 320
10.2. Advantages of Accelerator-Based Atomic Physics (ABAP) 321
10.3. Types of Accelerators Used in Accelerator-Based Atomic Physics 327
10.4. Electrostatic Accelerators 328
10.5. Electrodynamic Accelerators 333
References 340
Chapter 11. Ion Mass Analyzers 342
11.1. Introduction 342
11.2. Motion of Charged Particles in Electric and Magnetic Fields 343
11.3. Uniform Electric Fields 344
11.4. Uniform Magnetic Fields 356
11.5. Superimposed Electric and Magnetic Fields 361
References 367
Chapter 12. Ion Traps 370
12.1. Introduction 370
12.2. Types of Ion Trap 371
12.3. Trap Construction 373
12.4. Trapped Ion Detection, Diagnostics, and Cooling 377
References 380
Chapter 13. Ultra-High-Resolution Mass Spectroscopy in Penning Traps 384
13.1. Introduction 384
13.2. Trap Construction and Confinement 386
13.3. Basic Axial Resonance 389
13.4. Preparing the Ion Sample 392
13.5. Sideband Cooling Resonances 393
13.6. Magnetic Field Stability 395
13.7. Frequency-Shift Detector 397
13.8. Anharmonic Detection 399
13.9. The Ejection-Detection Method 401
13.10. The Pulse-and-Phase Method 403
13.11. Perturbations to the Cyclotron Frequency 405
References 408
Chapter 14. Electron Beam Ion Traps 412
14.1. Introduction 412
14.2. Principles of EBIT Operation 414
14.3. The 200-keV EBIT 421
14.4. X-ray Spectroscopy 423
14.5. Electron–Ion Collisions 431
14.6. Extraction of Highly Charged Ions from an EBIT 438
References 439
Chapter 15. DC Current Measurements 442
15.1. Introduction 442
15.2. Description and Comparison of Current Amplifiers 443
15.3. Signal Quantification and Conversion 452
15.4. Practical Experimental Considerations 453
References 455
Chapter 16. Signal Enhancement 458
16.1. Introduction 458
16.2. Noise Sources 459
16.3. Amplifiers 464
16.4. Signal Analysis 466
References 471
Index 474