On-Chip Instrumentation (eBook)
X, 244 Seiten
Springer US (Verlag)
978-1-4419-7563-8 (ISBN)
This book provides an in-depth overview of on chip instrumentation technologies and various approaches taken in adding instrumentation to System on Chip (ASIC, ASSP, FPGA, etc.) design that are collectively becoming known as Design for Debug (DfD). On chip instruments are hardware based blocks that are added to a design for the specific purpose and improving the visibility of internal or embedded portions of the design (specific instruction flow in a processor, bus transaction in an on chip bus as examples) to improve the analysis or optimization capabilities for a SoC. DfD is the methodology and infrastructure that surrounds the instrumentation. Coverage includes specific design examples and discussion of implementations and DfD tradeoffs in a decision to design or select instrumentation or SoC that include instrumentation. Although the focus will be on hardware implementations, software and tools will be discussed in some detail.
Chapter 1: Introduction 11
1.1 The Need for On-Chip Debug 11
1.2 Instrument- (**in-silicon) and EDA- (Presilicon) Based Verification 13
1.3 SoC Debug Requirements 17
1.4 Instrumentation-Based Debug Infrastructure 21
Chapter 2: On-Chip Instrumentation Components 26
2.1 Trace and Event Triggering 26
2.2 External Interfaces for On-Chip Instrumentation 27
2.3 Performance Analysis Using On-Chip Instrumentation 28
2.4 On-Chip Logic and Bus Analysis 29
2.5 On-Chip Instrumentation Examples 31
2.5.1 Trace Monitoring and Interfaces 31
2.5.2 Bus Logic Monitoring 32
2.5.3 Real-Time Data Exchange 34
2.6 Multiprocessor Debug 35
Chapter 3: JTAG Use in Debug 40
3.1 JTAG Pins 41
3.2 Test Access Port 44
3.3 JTAG Registers 47
3.4 JTAG Instructions 48
3.5 Boundary-Scan Description Language 49
3.6 The Road to JTAG: Historical Debug Approaches 54
3.6.1 Background Debug Mode 56
Chapter 4: Processor System Debug 58
4.1 A Processor Debug Instrument Implementation 61
4.2 Processor Trace Compression 64
4.3 Hunting Code Errors with Self-Trace 68
Chapter 5: An On-Chip Debug System 70
5.1 OCDS Features 71
5.1.1 Debug Events 73
5.1.2 Debug Event Actions 73
5.1.3 Debug Registers 74
5.2 Operation Modes 74
5.2.1 Entering Communication Mode 75
5.2.2 Communication Mode Instructions 75
5.2.3 Monitor-to-Debugger Host Data Transfer (Receive) 76
5.2.4 Debugger Host-to-Monitor Data Transfer (Send) 76
5.2.5 High-Level Synchronization 76
5.3 OCDS Registers 77
5.3.1 Debug Task ID Register 77
5.3.2 Instruction Pointer Register 77
5.3.3 Hardware Trigger Comparison Registers 78
5.3.4 Considerations on Accessing OCDS Registers 78
5.4 OCDS JTAG Access 79
5.4.1 Steps to Initialize the JTAG Module 81
5.5 OCDS Module Access 81
5.5.1 Error Protection 81
5.6 OCDS JTAG I/O Instructions 83
5.7 OCDS JTAG Registers 85
5.8 Hardware Triggers 86
5.8.1 Structure of a Noninterruptible Monitor Routine 88
5.8.2 Structure of an Interruptible Monitor Routine 88
5.8.3 Debug Event Control Registers 89
5.9 Additional Features 90
5.9.1 System Security 91
5.9.2 Reset from the JTAG Side 92
5.9.3 Reset from the Chip/Processor Side 92
Chapter 6: Bus System Debug 93
6.1 On-Chip Buses 93
6.2 Socket-Based SoC Design 95
6.2.1 SoC Interconnect Complexities 95
6.3 Bus-Level Integration 98
6.3.1 Bus Master Monitoring 99
6.3.2 Peripheral Bus Monitoring 99
6.3.3 Slave Monitoring 99
6.4 Internal and External Alternatives for Bus Trace 100
6.5 Programmable Bus Performance Monitoring 101
6.6 Bus Performance Monitoring 102
6.7 On-Chip and Off-Chip Analysis 106
6.8 Request Response Trace Bus Analysis 109
6.8.1 RRT Operations 111
6.8.2 RRT Implementation 112
Chapter 7: Multiprocessor Debugging 116
7.1 Cross-Triggering and Global Breakpoint Control 117
7.2 HyperDebug Distributed Cross-Triggering 117
7.2.1 HyperDebug Controller 119
7.2.2 Typical HyperDebug Implementation 120
7.3 Multicore Synchronization Triggering and Global Actions 122
Chapter 8: IEEE 1149.7: cJTAG/aJTAG 123
8.1 Test and Debug Views of 1149.7 124
8.2 Key T0–T5 Class Functions 126
8.3 MIPI Use of 1149.7 135
8.3.1 MIPI System Trace Module 136
8.4 Nexus Use of 1149.7 138
8.4.1 IEEE 1149.7/Nexus Integration 140
Chapter 9: IEEE P1687 – IJTAG 142
9.1 Overlap Zones and Gateway Elements 144
9.2 Classes of P1687 Instruments 146
9.3 IEEE 1500 Instruments 148
Chapter 10: OCP IP Debug Interfaces 150
10.1 OCP Multicore Debug 151
10.2 OCP Debug Features 154
10.3.1 Pure Software Debugging 1
10.3.2 Pure Hardware Debugging 1
10.3.3 System-on-Chip Debugging 1
10.4 Debug Components and IP Interfaces 157
10.5 Debug Socket Definitions 157
10.5.1 Core Debug Socket Interfaces 159
10.5.2 Cross-Triggering Socket Interfaces 162
10.5.3 OCP Synchronized Run Control 166
10.5.4 OCP Traffic-Monitoring and Trace Interfaces 167
10.5.5 Performance Monitoring 169
10.5.6 System Timestamping 170
10.5.7 Power Management Monitoring 171
10.5.8 Security Debug Interface 172
Chapter 11: Nexus IEEE 5001 173
11.1 Nexus Implementation Classes 175
11.2 Nexus Message Architecture 176
11.2.1 Nexus TCODEs 178
11.2.2 Nexus Registers 182
11.3 NEXUS Interfaces 184
11.3.1 Nexus JTAG Access 184
11.3.2 NEXUS AUX Interfaces 185
11.4 Multicore Nexus Debug Approaches 189
11.4.1 Input Tool-to-Target Messages 191
11.4.2 Output Target-to-Tool Messages 192
11.5 Nexus Product Implementations 193
11.6 Summary 197
Chapter 12: MIPS EJTAG 198
12.1 EJTAG Instructions and Registers 200
12.2 PC Sampling 202
12.3 MIPS PDtrace™ 202
12.3.1 Trace Output Formats 203
12.3.2 Trace Control Block Registers 207
12.4 TCB Trigger Logic Overview 209
12.5 PDtrace External Interface 210
12.6 TCtrace IF 212
12.7 PDTRACE Operations 213
Chapter 13: ARM ETM 215
13.1 ETM Signals 215
13.1.1 External Signals 216
13.2 ETM9 Registers 218
13.3 Trace Interface 220
Chapter 14: Infineon Multicore Debug Solution 221
14.1 MCDS Trace Protocol Definition 223
14.1.1 Data Trace 225
14.2 Debug Transactor: RUN Control Bus Master 226
14.3 MCDS Run Control: On-Chip Debug Support 227
14.3.1 BCU Level 1 (Bus-Observer Unit on the System Bus) 229
14.3.2 Concurrent Debugging in Level 3 MCDS (Two-Channel Tracing) 230
14.3.3 Debug Interface (Cerberus) (Debug Bus-Transactor Module) 230
14.4 RW Mode and Communication Mode 230
14.5 Multicore Break Switch 231
Chapter 15: EJTAG and Trace in Toshiba TX Cores 233
15.1 Processor Access Overview 234
15.2 Toshiba EJTAG Instructions and Registers 235
15.3 Debug Exceptions 237
15.4 Processor Debug Instructions and CP0 Registers 237
15.5 Break Functions 239
15.6 Output by PC Trace 240
b978-0-387-78701_4 1
| Erscheint lt. Verlag | 6.12.2010 |
|---|---|
| Zusatzinfo | X, 244 p. |
| Verlagsort | New York |
| Sprache | englisch |
| Themenwelt | Informatik ► Weitere Themen ► CAD-Programme |
| Naturwissenschaften | |
| Technik ► Elektrotechnik / Energietechnik | |
| Schlagworte | At-Speed Test • BIST • Debugging and Diagnosis • Debugging Clocking • Debugging Power • Delay Faults • Design for Debug • Design for Test • DFD • DFT • On-Chip Debug • On-Chip Instrumentation • Test Compression • Testing VLSI Circuits • Yield Learning |
| ISBN-10 | 1-4419-7563-2 / 1441975632 |
| ISBN-13 | 978-1-4419-7563-8 / 9781441975638 |
| Haben Sie eine Frage zum Produkt? |
PDF (Wasserzeichen)Größe: 7,7 MB
DRM: Digitales Wasserzeichen
Dieses eBook enthält ein digitales Wasserzeichen und ist damit für Sie personalisiert. Bei einer missbräuchlichen Weitergabe des eBooks an Dritte ist eine Rückverfolgung an die Quelle möglich.
Dateiformat: PDF (Portable Document Format)
Mit einem festen Seitenlayout eignet sich die PDF besonders für Fachbücher mit Spalten, Tabellen und Abbildungen. Eine PDF kann auf fast allen Geräten angezeigt werden, ist aber für kleine Displays (Smartphone, eReader) nur eingeschränkt geeignet.
Systemvoraussetzungen:
PC/Mac: Mit einem PC oder Mac können Sie dieses eBook lesen. Sie benötigen dafür einen PDF-Viewer - z.B. den Adobe Reader oder Adobe Digital Editions.
eReader: Dieses eBook kann mit (fast) allen eBook-Readern gelesen werden. Mit dem amazon-Kindle ist es aber nicht kompatibel.
Smartphone/Tablet: Egal ob Apple oder Android, dieses eBook können Sie lesen. Sie benötigen dafür einen PDF-Viewer - z.B. die kostenlose Adobe Digital Editions-App.
Buying eBooks from abroad
For tax law reasons we can sell eBooks just within Germany and Switzerland. Regrettably we cannot fulfill eBook-orders from other countries.
aus dem Bereich
