Atomic and Nuclear Analytical Methods (eBook)

Preface 6
Acknowledgement 7
Contents 8
1 X-ray Fluorescence (XRF) and Particle- Induced X- ray Emission (PIXE) 14
1.1 Introduction 14
1.2 Principle of XRF and PIXE Techniques 15
1.3 Theory and Concept 18
1.4 Instrumentation/Experimentation 25
1.5 Qualitative and Quantitative Analysis 61
1.6 Thick vs. Thin Samples 63
1.7 Counting Statistics and Minimum Detection Limit 75
1.8 Sources of Background 77
1.9 Methods for Improving Detection Limits 81
1.10 Computer Analysis of X-Ray Spectra 83
1.11 Some Other Topics Related to PIXE Analysis 84
1.12 Applications of XRF and PIXE Techniques 89
1.13 Comparison Between EDXRF and WDXRF Techniques 99
1.14 Comparison Between XRF and PIXE Techniques 100
1.15 Conclusion 103
2 Rutherford Backscattering Spectroscopy 104
2.1 Introduction 104
2.2 Scattering Fundamentals 105
2.3 Principle of Rutherford Backscattering Spectroscopy 117
2.4 Fundamentals of the RBS Technique and its Characteristics 120
2.5 Deviations from Rutherford Formula 123
2.6 Instrumentation/Experimental 126
2.7 RBS Spectra from Thin and Thick Layers 132
2.8 Spectrum Analysis/Simulation 139
2.9 Heavy Ion Backscattering Spectrometry 142
2.10 High-Resolution RBS 144
2.11 Medium Energy Ion Scattering 146
2.12 Channeling 148
2.13 Rutherford Scattering Using Forward Angles 150
2.14 Applications of RBS 152
2.15 Limitation of the RBS Technique 153
Exercises 153
3 Elastic Recoil Detection 156
3.1 Introduction 156
3.2 Fundamentals of the ERDA Technique 158
3.3 Principle and Characteristics of ERDA 162
3.4 Experimental 163
3.5 Heavy Ion ERDA 183
3.6 Data Analysis 186
3.7 Advantages and Limitations of ERDA 188
4 Mössbauer Spectroscopy (MS) 190
4.1 Introduction 190
4.2 Concept and Theory 191
4.3 Experimental Set-Up 205
4.4 Evaluation of Mössbauer Spectra 213
4.5 Conversion Electron Mössbauer Spectroscopy 214
4.6 Applications 218
5 X-Ray Photoelectron Spectroscopy 226
5.1 Introduction 226
5.2 Principle and Characteristics of XPS 227
5.3 Instrumentation/Experimental 232
5.4 Principle Photoelectron Lines for a Few Elements 245
5.5 Salient Features of XPS and a Few Practical Examples 245
5.6 Applications of XPS 250
5.7 Advantages and Limitations of XPS 254
6 Neutron Activation Analysis 256
6.1 Introduction 256
6.2 Principle 257
6.3 Experimental 260
6.4 Quantitative Analysis Using NAA 271
6.5 Sensitivities Available by NAA 274
6.6 Applications of NAA 275
6.7 Advantages and Limitations of NAA 280
7 Nuclear Reaction Analysis and Particle- Induced Gamma-Ray Emission 282
7.1 Introduction 282
7.2 Principle of NRA 284
7.3 Particle-Induced .-Emission Analysis 290
7.4 Experimental Methods 291
7.5 Detection Limit/Sensitivity 295
7.6 Applications of NRA 297
7.7 Applications of PIGE 300
7.8 Common Particle–Particle Nuclear Reactions 304
7.9 Some Important Reactions Used for PIGE Analysis 306
8 Accelerator Mass Spectrometry (AMS) 308
8.1 Introduction 308
8.2 Principle 310
8.3 Experimental 311
8.4 AMS Using Low-Energy Accelerators 316
8.5 Sample Preparation for AMS 318
8.6 Time-of-Flight Mass Spectrometry (TOF-MS) 319
8.7 Detection Limits of Particles Analyzed by AMS 321
8.8 Applications of AMS 322
8.9 Use of Various Isotopes for Important AMS Studies 329
8.10 AMS of Molecular Ions 331
8.11 Advantages and Limitations of AMS 332
A Appendix 336
A.1 Some Useful Data Tables 336
B Appendix 346
B.1 Relation of Energies, Scattering Angles, and Rutherford Scattering Cross- Sections in the Center- of- Mass System and Laboratory System 346
C Appendix 352
References 354
Index 378