Scanning Probe Microscopy in Nanoscience and Nanotechnology 3

Bharat Bhushan (Herausgeber)

Buch | Hardcover
XX, 630 Seiten
2012 | 2012
Springer Berlin (Verlag)
978-3-642-25413-0 (ISBN)
192,59 inkl. MwSt
This book presents the physical and technical foundation of the state of the art in applied scanning probe techniques. It constitutes a timely and comprehensive overview of SPM applications. The chapters in this volume relate to scanning probe microscopy techniques, characterization of various materials and structures and typical industrial applications, including topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters are written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective.

Bharat Bhushan is Ohio Eminent Scholar and The Howard D. Winbigler Professor at the College of Engineering, and Director of the Nanoprobe Laboratory for Bio- & Nanotechnology and Biomimetics (NLB2) at Ohio State University, Columbus, OH. He authored 6 scientific books, more than 90 handbook chapters, more than 700 scientific papers (h factor – 42+), and more than 60 scientific reports, edited more than 45 books, and holds 17 U.S. and foreign patents. Bharat Bhusan received numerous prestigious awards and international fellowships including the Alexander von Humboldt Research Prize for Senior Scientists, Max Planck Foundation Research Award for Outstanding Foreign Scientists, and the Fulbright Senior Scholar Award. He worked for various research labs including IBM Almaden Research Center, San Jose, CA.

Part 1: Scanning probe microscopy techniques- Spectroscopic techniques in SPM- High speed AFM imaging.- New developments in imaging of biological samples.- New developments in AFM.- SNOM.- Part 2: Nanocharacterization.- Antibodies for protein recognition.- In-situ imaging of living cells.- In-situ crystallization of wax materials.- Part 3: Biomimetics and industrial applications.- Electrowetting and switchable hydrophobicity.- Renewable energy applications.- AFMs in hard disk industry.

Erscheint lt. Verlag 16.10.2012
Reihe/Serie NanoScience and Technology
Zusatzinfo XX, 630 p.
Verlagsort Berlin
Sprache englisch
Maße 155 x 235 mm
Gewicht 1098 g
Themenwelt Naturwissenschaften Physik / Astronomie Atom- / Kern- / Molekularphysik
Naturwissenschaften Physik / Astronomie Festkörperphysik
Technik
Schlagworte Abtastung (Technik) • Atomic force microscopy • biological nanocharacterization • Biometrie • Biomimetics • High-speed AFM imaging • MEMS (Mikroelektromechanische Systeme) • Mikroskopie • Nanotechnologie • overview of SPM applications • Rasterelektronenmikroskopie • Scanning Probe Microscopy • Scanning Tunneling Microscopy • SNOM • spectroscopic techniques in SPM
ISBN-10 3-642-25413-6 / 3642254136
ISBN-13 978-3-642-25413-0 / 9783642254130
Zustand Neuware
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