Scanning Probe Microscopy of InAs/InP Nanowires - Stephan Pröller

Scanning Probe Microscopy of InAs/InP Nanowires

Buch | Softcover
64 Seiten
2011 | 3. Auflage
GRIN Verlag
978-3-656-01049-4 (ISBN)
27,95 inkl. MwSt
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Bachelor Thesis from the year 2011 in the subject Physics - Other, grade: 1,0, LMU Munich, language: English, abstract: In this thesis the InAs(111)B surface and III-V semiconductor nanowires are investigated using scanning tunneling microscopy and spectroscopy. The morphology of InAs nanowires grown without gold particle is studied. Radial nanowire heterostructure such as InP core with InAs shell are analyzed and the wurtzite top facet is identified. Furthermore nanowire heterostructures with an InP core and InAs shell with induced stacking faults possibly giving rise to quantum dots, which could be used as quantum dot lasers or for quantum information processing, are investigated. A model is obtained based on morphology analysis and as top facet the wurtzite and are found. Furthermore stacking faults on top of a nanowire are seen.
The analysis of the InAs(111)B surface shows the hexagonal pattern. Defects are determined to occur due to missing In atoms in the first layer. Spectroscopy next to those defects indicated no influence on the local electronic structure.
Erscheint lt. Verlag 6.10.2011
Reihe/Serie Aus der Reihe: e-fellows.net stipendiaten-wissen
Sprache englisch
Maße 148 x 210 mm
Gewicht 105 g
Themenwelt Naturwissenschaften Physik / Astronomie
Schlagworte inas/inp • Microscopy • Nanowires • Probe • Scanning
ISBN-10 3-656-01049-8 / 3656010498
ISBN-13 978-3-656-01049-4 / 9783656010494
Zustand Neuware
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