Semiconductor Research
Experimental Techniques
Seiten
2012
|
2012
Springer Berlin (Verlag)
978-3-642-23350-0 (ISBN)
Springer Berlin (Verlag)
978-3-642-23350-0 (ISBN)
The book describes the fundamentals, latest developments and use of key experimental techniques for semiconductor research. It explains the application potential of various analytical methods and discusses the opportunities to apply particular analytical techniques to study novel semiconductor compounds, such as dilute nitride alloys. The emphasis is on the technique rather than on the particular system studied.
Electron Diffraction: RHEED and LEED.- Transmission Electron Microscopy and Energy-Dispersive X-ray Spectroscopy.- Techniques for Surface Characterization.- Optical Modulation Spectroscopy.- Photoluminescence and Magnetophotoluminescence.- High Pressure Studies.- Microphotoluminescence, Scanning Near-Field Optical Microscopy and Cathodoluminescence.- Time Resolved Optical Spectroscopy.- Raman Spectroscopy.- Cyclotron Resonance.- Transport in High Magnetic Fields.- Photoconductivity.- Hot Carrier Transport.
Erscheint lt. Verlag | 13.4.2012 |
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Reihe/Serie | Springer Series in Materials Science |
Zusatzinfo | XX, 372 p. |
Verlagsort | Berlin |
Sprache | englisch |
Maße | 155 x 235 mm |
Gewicht | 716 g |
Themenwelt | Naturwissenschaften ► Physik / Astronomie ► Atom- / Kern- / Molekularphysik |
Technik ► Elektrotechnik / Energietechnik | |
Schlagworte | catodoluminescence • Cyclotron resonance • Halbleiter • hot carrier transport • optical modulation spectroscopy • photoluminescence • Raman spectroscopy • scaning near field optical microscopy • time resolved optical spectroscopy • transmision electron microscopy • transport in high magnetic fields |
ISBN-10 | 3-642-23350-3 / 3642233503 |
ISBN-13 | 978-3-642-23350-0 / 9783642233500 |
Zustand | Neuware |
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