Scanning Probe Microscopy of Functional Materials
Springer-Verlag New York Inc.
978-1-4419-6567-7 (ISBN)
Sergei Kalinin is a researcher at Oak Ridge National Laboratory. Alexei Gruverman is an associate professor at University of Nebraska-Lincoln.
I. Emergent phenomena in strongly-correlated systems: Phase separation and novel quaziparticles in nanowires.- STM of ruthenates and manganites.- STM of superconductors.- STM of cuprates.- II. Semiconductor and photovoltaic materials: SPM of solar materials.- Cross-sectional STM of semiconductor heterostructures.- Charge dynamics in photovoltaic polymers.- III. Functional probing of biosystems and macromolecules: Molecular Imaging of biomembranes single molecules with electrically functionalized probes.- AFM/patch clamp in biology.- Electrical imaging of membranes.- Cell dynamics by Ion conductance microscopy.- Ferroelectric polymers.- IV. SPM of magnetic materials: Spin manipulation by STM.- Magnetic Resonant Force Microscopy.- Magnetic Force Microscopy.- V. Electromechanics on the nanoscale: ferroelectrics and multiferroics: New dynamic modes and energy dissipation in SPM.- Polarization dynamics in relaxor ferroelectrics.- Piezoresponse Force Spectroscopy.- Polarization dynamics in capacitors and heterostructures.- VI. Mechanical properties: Nanomechanics by SPM.- Atomic Force Acoustic Microscopy of functional materials.- VII. Optical methods: NSOM and NSOM-transport.- NSOM.- Optical machines and unfolding.- Optically-assisted pump-probe STM.- VIII. Emerging SPM applications: STM/NC-AFM.- Scanning Non-linear Dielectric Microscopy.- Vibrational spectroscopy of single molecule.- Ultrafast ac STM.- SPM and electron microscopy combined.- In-situ STEM-nanoindentation.- Material characterization by SPM-focused X-ray combination.-
*see Long ToC for tentative contributors.
Erscheint lt. Verlag | 10.12.2010 |
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Zusatzinfo | XVIII, 555 p. |
Verlagsort | New York, NY |
Sprache | englisch |
Maße | 155 x 235 mm |
Themenwelt | Naturwissenschaften ► Chemie ► Analytische Chemie |
Technik ► Maschinenbau | |
Schlagworte | Functional Materials • Nanoscale Characterization • Scanning Probe Microscopy |
ISBN-10 | 1-4419-6567-X / 144196567X |
ISBN-13 | 978-1-4419-6567-7 / 9781441965677 |
Zustand | Neuware |
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