X-Ray Optics and Microanalysis

Reports the progress in fundamental and applied research in x-ray optics and micro- and nano-analysis by means of x-ray beams, electrons or other energetic particles, including application examples, as well as methodological and instrumental developments.

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"ICXOM Series" is a platform dedicated for reporting progress in fundamental and applied research in x-ray optics and micro- and nano-analysis by means of x-ray beams (with an ICXOM20 emphasis on synchrotron sources), electrons or other energetic particles, including application examples, as well as methodological and instrumental developments.