X-Ray Optics and Microanalysis

Buch | Hardcover
228 Seiten
2010
American Institute of Physics (Verlag)
978-0-7354-0764-0 (ISBN)

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Reports the progress in fundamental and applied research in x-ray optics and micro- and nano-analysis by means of x-ray beams, electrons or other energetic particles, including application examples, as well as methodological and instrumental developments.
"ICXOM Series" is a platform dedicated for reporting progress in fundamental and applied research in x-ray optics and micro- and nano-analysis by means of x-ray beams (with an ICXOM20 emphasis on synchrotron sources), electrons or other energetic particles, including application examples, as well as methodological and instrumental developments.
Erscheint lt. Verlag 4.6.2010
Reihe/Serie AIP Conference Proceedings / Atomic, Molecular, Chemical Physics ; 1221
Zusatzinfo Illustrations
Verlagsort New York
Sprache englisch
Einbandart gebunden
Themenwelt Naturwissenschaften Physik / Astronomie Atom- / Kern- / Molekularphysik
Naturwissenschaften Physik / Astronomie Plasmaphysik
ISBN-10 0-7354-0764-9 / 0735407649
ISBN-13 978-0-7354-0764-0 / 9780735407640
Zustand Neuware
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