Advances in Imaging and Electron Physics

Advances in Imaging and Electron Physics

Optics of Charged Particle Analyzers
Buch | Hardcover
296 Seiten
2010
Academic Press Inc (Verlag)
978-0-12-381316-9 (ISBN)
219,95 inkl. MwSt
Includes articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in different domains.
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.

This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 – 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.

1. Energy Filtered X-ray Photoemission electronmicroscopy(EXPEEM)- Kiyotaka Asakura

2. Image contrast in aberration-corrected scanningconfocal electron microscopy- E.C. Cosgriff

3. Comparison of color demosaicing methods- O. Lossona

4. New dimensions for field emission: effects of structure in the emitting surface- C. J. Edgcombe

5. Conductivity Imaging and Generalised RadonTransform: a review- Archontis Giannakidis

6. Identification Of Historical Pigments In Wall Layers By Combination Of Optical And Scanning Electron Microscopy Coupled To Energy Dispersive Spectroscopy- A. Sever Škapin

Erscheint lt. Verlag 6.8.2010
Reihe/Serie Advances in Imaging and Electron Physics
Mitarbeit Herausgeber (Serie): Peter W. Hawkes
Verlagsort San Diego
Sprache englisch
Maße 152 x 229 mm
Gewicht 530 g
Themenwelt Naturwissenschaften Physik / Astronomie Angewandte Physik
Naturwissenschaften Physik / Astronomie Optik
Technik
ISBN-10 0-12-381316-6 / 0123813166
ISBN-13 978-0-12-381316-9 / 9780123813169
Zustand Neuware
Haben Sie eine Frage zum Produkt?
Mehr entdecken
aus dem Bereich