Strain Effect in Semiconductors

Theory and Device Applications
Buch | Hardcover
350 Seiten
2009
Springer-Verlag New York Inc.
978-1-4419-0551-2 (ISBN)

Lese- und Medienproben

Strain Effect in Semiconductors - Yongke Sun, Scott E. Thompson, Toshikazu Nishida
160,49 inkl. MwSt
Strain Effect in Semiconductors: Theory and Device Applications presents the fundamentals and applications of strain in semiconductors and semiconductor devices that is relevant for strain-enhanced advanced CMOS technology and strain-based piezoresistive MEMS transducers. Discusses relevant applications of strain while also focusing on the fundamental physics pertaining to bulk, planar, and scaled nano-devices. Hence, this book is relevant for current strained Si logic technology as well as for understanding the physics and scaling for future strained nano-scale devices.

Overview: The Age of Strained Devices.- Band Structures of Strained Semiconductors.- Stress, Strain, Piezoresistivity, and Piezoelectricity.- Strain and Semiconductor Crystal Symmetry.- Band Structures of Strained Semiconductors.- Low-Dimensional Semiconductor Structures.- Transport Theory of Strained Semiconductors.- Semiconductor Transport.- Strain in Semiconductor Devices.- Strain in Electron Devices.- Piezoresistive Strain Sensors.- Strain Effects on Optoelectronic Devices.

Erscheint lt. Verlag 4.12.2009
Zusatzinfo XII, 350 p.
Verlagsort New York, NY
Sprache englisch
Maße 155 x 235 mm
Themenwelt Naturwissenschaften Physik / Astronomie Festkörperphysik
Technik Elektrotechnik / Energietechnik
ISBN-10 1-4419-0551-0 / 1441905510
ISBN-13 978-1-4419-0551-2 / 9781441905512
Zustand Neuware
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