Inverse Problems and Imaging

Lectures given at the C.I.M.E. Summer School held in Martina Franca, Italy, September 15-21, 2002

Luis L. Bonilla (Herausgeber)

Buch | Softcover
XI, 200 Seiten
2008 | 2008
Springer Berlin (Verlag)
978-3-540-78545-3 (ISBN)

Lese- und Medienproben

Inverse Problems and Imaging -
48,10 inkl. MwSt
lt;p>Nowadays we are facing numerous and important imaging problems: nondestructive testing of materials, monitoring of industrial processes, enhancement of oil production by efficient reservoir characterization, emerging developments in noninvasive imaging techniques for medical purposes - computerized tomography (CT), magnetic resonance imaging (MRI), positron emission tomography (PET), X-ray and ultrasound tomography, etc. In the CIME Summer School on Imaging (Martina Franca, Italy 2002), leading experts in mathematical techniques and applications presented broad and useful introductions for non-experts and practitioners alike to many aspects of this exciting field. The volume contains part of the above lectures completed and updated by additional contributions on other related topics.

to Image Reconstruction.- X-ray Tomography.- Adjoint Fields and Sensitivities for 3D Electromagnetic Imaging in Isotropic and Anisotropic Media.- Polarization-Based Optical Imaging.- Topological Derivatives for Shape Reconstruction.- Time-Reversal and the Adjoint Imaging Method with an Application in Telecommunication.- A Brief Review on Point Interactions.

Erscheint lt. Verlag 18.4.2008
Reihe/Serie C.I.M.E. Foundation Subseries
Lecture Notes in Mathematics
Co-Autor Ana Carpio, Oliver Dorn, Miguel Moscoso, Frank Natterer, George Papanicolaou, Maria Luisa Rapun, Alessandro Teta
Zusatzinfo XI, 200 p.
Verlagsort Berlin
Sprache englisch
Maße 155 x 235 mm
Gewicht 313 g
Themenwelt Mathematik / Informatik Mathematik Allgemeines / Lexika
Schlagworte 65R32; 44A12, 92C55; 85A25; 35Q40 • Computed tomography (CT) • electromagnetic and optical imaging • image reconstruction • Inverse Problems • topological derivatives • X-ray tomography
ISBN-10 3-540-78545-0 / 3540785450
ISBN-13 978-3-540-78545-3 / 9783540785453
Zustand Neuware
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