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Modern Map Methods in Particle Beam Physics

Buch | Hardcover
318 Seiten
1999
Academic Press Inc (Verlag)
978-0-12-014750-2 (ISBN)
219,95 inkl. MwSt
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This series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing; electromagnet wave propagation, electron microscopy, and computing methods in these domains.
Advances in Imaging & Electron Physics merges two long-running serials--Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 – 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.

Dynamics. Differential Algebraic Techniques. Fields. Maps: Calculation. Maps: Properties. Spectrometers. Repetitive Systems.

Erscheint lt. Verlag 22.9.1999
Reihe/Serie Advances in Imaging and Electron Physics
Mitarbeit Herausgeber (Serie): Peter W. Hawkes
Verlagsort San Diego
Sprache englisch
Maße 152 x 229 mm
Gewicht 610 g
Themenwelt Informatik Grafik / Design Digitale Bildverarbeitung
Naturwissenschaften Physik / Astronomie Hochenergiephysik / Teilchenphysik
Naturwissenschaften Physik / Astronomie Optik
Technik
ISBN-10 0-12-014750-5 / 0120147505
ISBN-13 978-0-12-014750-2 / 9780120147502
Zustand Neuware
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