Scan Statistics

Methods and Applications
Buch | Hardcover
394 Seiten
2009
Birkhauser Boston Inc (Verlag)
978-0-8176-4748-3 (ISBN)
192,59 inkl. MwSt
Filling a gap in the literature, this volume brings together a collection of selected chapters illustrating the depth and diversity of theory, methods and applications in the area of scan statistics. Key features include current results and new directions.
Scan statistics is currently one of the most active and important areas of research in applied probability and statistics, having applications to a wide variety of fields: archaeology, astronomy, bioinformatics, biosurveillance, molecular biology, genetics, computer science, electrical engineering, geography, material sciences, physics, reconnaissance, reliability and quality control, telecommunication, and epidemiology.


Filling a gap in the literature, this self-contained volume brings together a collection of selected chapters illustrating the depth and diversity of theory, methods and applications in the area of scan statistics. The chapters are written by leading experts in the field of scan statistics. Key features include many current results and new directions for future research; challenging theoretical methodological research problems; presentation accessible to both statisticians and scientists from other disciplines where scan statistics are employed; emphasis on real-world applications to areas such as bioinformatics and biosurveillance; and extensive references to research articles, books, and relevant computer software.


Scan Statistics is an excellent reference for graduate students and researchers in applied probability and statistics, as well as for scientists in biology, computer science, pharmaceutical science, medicine, geography, quality control, communications, and epidemiology. The work may also be used as a textbook for a graduate-level seminar on scan statistics.

Joseph Naus: Father of the Scan Statistic.- Precedence-Type Tests for the Comparison of Treatments with a Control.- Extreme Value Results for Scan Statistics.- Boundary Crossing Probability Computationsin the Analysis of Scan Statistics.- Approximations for Two-Dimensional Variable Window Scan Statistics.- Applications of Spatial Scan Statistics: A Review.- Extensions of the Scan Statistic for the Detection and Inference of SpatialClusters.- 1-Dependent Stationary Sequences and Applications to Scan Statistics.- Scan Statistics in Genome-Wide Scan for Complex Trait Loci.- On Probabilities for Complex Switching Rules in Sampling Inspection.- Bayesian Network Scan Statistics for Multivariate Pattern Detection.- ULS Scan Statistic for Hotspot Detection with Continuous Gamma Response.- False Discovery Control for Scan Clustering.- Martingale Methods for Patterns and Scan Statistics.- How Can Pattern Statistics Be Useful for DNA Motif Discovery?.- Occurrence of Patterns and Motifs in Random Strings.- Detection of Disease Clustering.

Reihe/Serie Statistics for Industry and Technology
Zusatzinfo 40 Illustrations, black and white; XXVIII, 394 p. 40 illus.
Verlagsort Secaucus
Sprache englisch
Maße 178 x 254 mm
Themenwelt Mathematik / Informatik Mathematik Statistik
Mathematik / Informatik Mathematik Wahrscheinlichkeit / Kombinatorik
ISBN-10 0-8176-4748-1 / 0817647481
ISBN-13 978-0-8176-4748-3 / 9780817647483
Zustand Neuware
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