Genetic Algorithms for VLSI Design, Layout and Test Automation - Pinaki Mazumder, Elizabeth Rudnick

Genetic Algorithms for VLSI Design, Layout and Test Automation

Buch | Softcover
352 Seiten
1998
Addison Wesley (Verlag)
978-0-13-011566-9 (ISBN)
149,95 inkl. MwSt
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Genetic algorithms mimic the natural process of evolution, helping engineers optimize their designs by using the principle of "survival of the fittest." VLSI is especially suited to benefit from genetic algorithms - and this book shows the reader how to get results faster.
Genetic algorithms mimic the natural process of evolution, helping engineers optimize their designs by keeping the "fittest" code and weeding out the most inefficient. VLSI is especially well-suited to benefiting from genetic algorithms -- and this thorough, practical tutorial shows you how to get the best results, fast.KEY TOPICS:Learn how genetic algorithms work and how you can use them in a wide variety of VLSI design, layout, and test automation tasks. Master specific techniques for working with genetic algorithms in partitioning, automatic standard cell and macro cell placement, routing, technology mapping for FPGAs, automatic test generation, peak power estimation, and more -- each with detailed examples you can adapt to your own design challenges. Discover how genetic algorithms are being incorporated into leading commercial electronic design automation tools such as Verilog and VHDL. With this book, you can start leveraging the major performance improvements genetic algorithms offer, with expert help and as little complexity as possible.MARKET:All electrical engineers working in VLSI design, as well as other professionals interested in practical applications for genetic algorithms.

PINAKI MAZUMDER is Professor in the Department of Electrical Engineering and Computer Science at The University of Michigan, Ann Arbor. He has worked for over six years at AT&T Bell Laboratories (USA), NTT (Japan), and BEL (India). He has coauthored a book entitled Testing and Testable Design of High-Density Random-Access Memories and has published over 100 archival papers on VLSI testing, physical design automation, and high-speed circuit design. ELIZABETH M. RUDNICK is Assistant Professor at the Center for Reliable and High-Performance Computing and the Department of Electrical and Computer Engineering, University of Illinois, Urbana. She has worked at Motorola, Sunrise Test Systems, and AMD, specializing in design verification, test generation, and electronic design automation.

Erscheint lt. Verlag 24.12.1998
Verlagsort Boston
Sprache englisch
Maße 243 x 185 mm
Gewicht 649 g
Themenwelt Informatik Grafik / Design Digitale Bildverarbeitung
Informatik Theorie / Studium Künstliche Intelligenz / Robotik
ISBN-10 0-13-011566-5 / 0130115665
ISBN-13 978-0-13-011566-9 / 9780130115669
Zustand Neuware
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