Fractal Tomography for Power Grids (eBook)
XXII, 82 Seiten
Springer Nature Singapore (Verlag)
978-981-99-3443-0 (ISBN)
The book introduces a new concept of Fractal Tomograph (FT) to study large and small perturbations of power grids. A mathematical phrase called Active Network Twins (ANT) is discovered which bears astonishing similarity with the human DNA. ANT forms the backbone of analysis. Lineflows and load voltages are compositions of ANT, called fractals which constitute tomographs. First three chapters discuss these new concepts. A remarkable feature is that a minute observation of tomograph is sufficient to detect a malaise in the past, present, or future of the grid. Editing like in genes, to control flows and voltages, is explained in chapter 4. The baffling loop flows in the US-Canada region, a metropolitan blackout in India, and outages in Nepal are illustrated with notional networks. Causes are crisply identified (chapters 5 and 6). Frequency rendezvous and blockchain approach to electricity costs (chapters 7, 8) are radically new perspectives. The book is useful for grid controllers and researchers.
S. D. Varwandkar was born in 1944. He obtained his B.Sc. (Engineering) from Maulana Azad College of Technology (now a National Institute of Technology) and Ph.D. from IIT Kanpur, India. He has been a member of faculty at V. J. Technological Institute, Mumbai, from 1969 up to 2004 when he retired as the director of the Institute. He conducted projects for power companies, the Board of Research in Nuclear Sciences (BRNS), and was the consultant to Crompton Greaves for a brief period. He has guided 3 Ph.D. and many M.Tech. students and published many research papers in peer-reviewed journals.
Prof. M. V. Hariharan was born in 1933. He is an awardee of Governor's Gold Medal for standing first in his B.Tech. in the entire state of Madras (now Chennai) in 1959. He did his Masters at Indian Institute of Science, Bangalore, in 1957 and was associated with stability studies in very long EHV lines with Prof. V. A. Venikov at Moscow Power Institute where he obtained his Ph.D. in 1962. He has published many research papers in peer-reviewed journals. His research interests include scaled down modeling of generators, transmission lines and transformers; power system stabilizers, and optimization methods. He has taught at UG/PG level and guided many Ph.D. students at Indian Institute of Technology Bombay, Mumbai, and was a consultant to many power companies.
The book introduces a new concept of Fractal Tomograph (FT) to study large and small perturbations of power grids. A mathematical phrase called Active Network Twins (ANT) is discovered which bears astonishing similarity with the human DNA. ANT forms the backbone of analysis. Lineflows and load voltages are compositions of ANT, called fractals which constitute tomographs. First three chapters discuss these new concepts. A remarkable feature is that a minute observation of tomograph is sufficient to detect a malaise in the past, present, or future of the grid. Editing like in genes, to control flows and voltages, is explained in chapter 4. The baffling loop flows in the US-Canada region, a metropolitan blackout in India, and outages in Nepal are illustrated with notional networks. Causes are crisply identified (chapters 5 and 6). Frequency rendezvous and blockchain approach to electricity costs (chapters 7, 8) are radically new perspectives. The book is useful for grid controllers and researchers.
Erscheint lt. Verlag | 26.6.2023 |
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Reihe/Serie | SpringerBriefs in Applied Sciences and Technology | SpringerBriefs in Computational Intelligence |
Zusatzinfo | XXII, 82 p. 44 illus., 22 illus. in color. |
Sprache | englisch |
Themenwelt | Informatik ► Theorie / Studium ► Künstliche Intelligenz / Robotik |
Technik ► Bauwesen | |
Technik ► Elektrotechnik / Energietechnik | |
Technik ► Maschinenbau | |
Schlagworte | BLACKOUT ANALYSIS • DYNAMICS OF FREQUENCY RENDEZVOUS • LINE FLOWS • LOAD VOLTAGES • LOOP FLOW ANALYSIS • MW-COSTING • power grid operation • Power Markets |
ISBN-10 | 981-99-3443-5 / 9819934435 |
ISBN-13 | 978-981-99-3443-0 / 9789819934430 |
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