Structural, Syntactic, and Statistical Pattern Recognition

Joint IAPR International Workshops, S+SSPR 2022, Montreal, QC, Canada, August 26–27, 2022, Proceedings

Adam Krzyzak, Ching Y. Suen, Andrea Torsello, Nicola Nobile (Herausgeber)

Buch | Softcover

XIII, 324 Seiten

2023 | 1st ed. 2022
Springer International Publishing (Verlag)
978-3-031-23027-1 (ISBN)

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This book constitutes the proceedings of the Joint IAPR International Workshop on Structural, Syntactic, and Statistical Pattern Recognition, S+SSPR 2022, held in Montreal, QC, Canada, in August 2022.

The 30 papers together with 2 invited talks presented in this volume were carefully reviewed and selected from 50 submissions. The workshops presents papers on topics such as deep learning, processing, computer vision, machine learning and pattern recognition and much more.

Erscheinungsdatum	05.01.2023
Reihe/Serie	Lecture Notes in Computer Science
Zusatzinfo	XIII, 324 p. 118 illus., 93 illus. in color.
Verlagsort	Cham
Sprache	englisch
Maße	155 x 235 mm
Gewicht	485 g
Themenwelt	Informatik ► Theorie / Studium ► Künstliche Intelligenz / Robotik
Schlagworte	Applications • Artificial Intelligence • Computer Networks • Computer Science • Computer systems • computer vision • conference proceedings • Databases • Education • Engineering • graph theory • Image Analysis • Image Processing • image reconstruction • Informatics • Internet • learning • machine learning • Mathematics • Neural networks • pattern recognition • Research • Signal Processing • statistical pattern recognition • structural pattern recognition • supervised learning • theoretical computer science
ISBN-10	3-031-23027-2 / 3031230272
ISBN-13	978-3-031-23027-1 / 9783031230271
Zustand	Neuware