Formal Methods for Industrial Critical Systems -

Formal Methods for Industrial Critical Systems

26th International Conference, FMICS 2021, Paris, France, August 24–26, 2021, Proceedings
Buch | Softcover
XII, 249 Seiten
2021 | 1st ed. 2021
Springer International Publishing (Verlag)
978-3-030-85247-4 (ISBN)
53,49 inkl. MwSt

This book constitutes the proceedings of the 26th International Workshop on Formal Methods for Industrial Critical Systems, FMICS 2021, which was held during August 24-26, 2021. The conference was planned to take place in Pairs, France. Due to the COVID-19 pandemic it changed to a virtual event.

The 10 full papers and 6 short papers presented in this volume were carefully reviewed and selected from 31 submissions. The papers are organized in topical sections as follows: Verification, Program Safety and Education, (Event-)B Modeling and Validation, Formal Analysis, Tools, Test Generation and Probabilistic Verification.

Verification.- Verification of Co-Simulation Algorithms Subject to Algebraic Loops and Adaptive Steps.- Automated Verification of Temporal Properties of Ladder Programs.- Spatial Model Checking for Smart Stations: Research Challenges.- Program Safety and Education.- Parametric Faults in Safety Critical Programs.- Modular Transformation of Java Exceptions Modulo Errors.- On education and training in formal methods for industrial critical systems .- (Event-)B Modeling and Validation.- Improving SMT Solver Integrations for the Validation of B and Event-B Models.- Standard Conformance-by-Construction with Event-B.- Formal Analysis.- Randomized Reachability Analysis in Uppaal: Fast Error Detection in Timed Systems.- Verifying the Mathematical Library of an UAV Autopilot with Frama-C.- Formal Analysis of the UNISIG Safety Application Intermediate Sub-Layer.- Tools.- ProB2-UI: A Java-based User Interface for ProB.- Intrepid: a Scriptable and Cloud-ready SMT-based Model Checker.- Merit and Blame Assignment with Kind 2.- Test Generation and Probabilistic Verification.- PSY-TaLiRo: A Python Toolbox for Search-Based Test Generation for Cyber-Physical Systems.- Probabilistic Verification for Reliability of a Two-by-Two Network-on-Chip System.

Erscheinungsdatum
Reihe/Serie Lecture Notes in Computer Science
Programming and Software Engineering
Zusatzinfo XII, 249 p. 23 illus.
Verlagsort Cham
Sprache englisch
Maße 155 x 235 mm
Gewicht 405 g
Themenwelt Mathematik / Informatik Informatik Programmiersprachen / -werkzeuge
Informatik Theorie / Studium Compilerbau
Schlagworte Applications • architecture verification and validation • Artificial Intelligence • Computer Hardware • computer programming • Computer Science • conference proceedings • Embedded Systems • field programmable gate array • Formal Languages • Formal Logic • formal methods • FPGA • Fuzzy Sets • Informatics • Model Checking • object-oriented programming • Research • Signal Processing • software architecture • Software Design • Software engineering
ISBN-10 3-030-85247-4 / 3030852474
ISBN-13 978-3-030-85247-4 / 9783030852474
Zustand Neuware
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