Software Failure Investigation - Jan Eloff, Madeleine Bihina Bella

Software Failure Investigation

A Near-Miss Analysis Approach
Buch | Softcover
IX, 119 Seiten
2018 | 1. Softcover reprint of the original 1st ed. 2018
Springer International Publishing (Verlag)
978-3-319-87054-0 (ISBN)
128,39 inkl. MwSt
This book reviews existing operational software failure analysis techniques and proposes near-miss analysis as a novel, and new technique for investigating and preventing software failures. The authors provide details on how near-miss analysis techniques focus on the time-window before the software failure actually unfolds, so as to detect the high-risk conditions that can lead to a major failure. They detail how by alerting system users of an upcoming software failure, the detection of near misses provides an opportunity to collect at runtime failure-related data that is complete and relevant. They present a near-miss management systems (NMS) for detecting upcoming software failures, which can contribute significantly to the improvement of the accuracy of the software failure analysis. A prototype of the NMS is implemented and is discussed in the book. The authors give a practical hands-on approach towards doing software failure investigations by means of near-miss analysis that is ofuse to industry and academia

Professor Jan Eloff graduated in 1985 with a PhD in Computer Science. Up to June 2015 he was appointed as the Research Director for SAP Research in Africa and is currently appointed as Deputy Dean Research & Postgraduate studies: Faculty of Eng., Built Environment and IT (EBIT) and as a full professor in computer science at the University of Pretoria. From 2007 he is an associate-editor of the Computers & Security journal and an editorial member for the international Computer Fraud & Security bulletin published by Elsevier. He is an internationally recognised researcher and has published 113 peer reviewed papers with 3537 citations. Dr. Madeleine Bihina Bella has over 10 years of industry experience with expertise in IT security and business analysis working in leading roles in a number of multinationals across various industries. She is also a part-time computer science lecturer. In 2015 she graduated with a PhD in Computer Science from the University of Pretoria specializing in the field of digital forensics. Her research focused on near-miss analysis as a novel technique to improve the forensic investigation of software failures. ". She received a number of awards for her doctoral research including the South African Women in Science Award, the Google Women Techmakers sholarship and the L'Oreal/UNESCO Regional Fellowship for Women in Science in Sub-Saharan Africa. She has published a number of journal and conference papers.

Chap1: Introduction.- Chap2: Software Failures: An Overview.- Chap3: Near-Miss Analysis: An Overview.- Chap4: A Methodology for Investigating Software Failures Using Digital Forensics and Near-Miss Analysis.- Chap5: A Well-Defined Model for Near-Miss Detection And Prioritisation.- Chap6: An Architecture for a Near-Miss System (Nms).- Chap7: Practical Demonstration of Conducting a Near-Miss Analysis Investigation for Software Failures.

Erscheint lt. Verlag 18.8.2018
Zusatzinfo IX, 119 p. 83 illus., 21 illus. in color.
Verlagsort Cham
Sprache englisch
Maße 155 x 235 mm
Gewicht 214 g
Themenwelt Mathematik / Informatik Informatik Software Entwicklung
Technik Elektrotechnik / Energietechnik
Technik Maschinenbau
Technik Nachrichtentechnik
Schlagworte digital forensics • downtime • Failure analysis • forensic investigation • Near-miss analysis • Near-miss management system (NMS) • Quality Control, Reliability, Safety and Risk • Reliability • Root-cause analysis • Software failure
ISBN-10 3-319-87054-8 / 3319870548
ISBN-13 978-3-319-87054-0 / 9783319870540
Zustand Neuware
Haben Sie eine Frage zum Produkt?
Mehr entdecken
aus dem Bereich
Entwurfsmuster für effektive Softwareentwicklung

von Karl Eilebrecht; Gernot Starke

Buch | Softcover (2024)
Springer Vieweg (Verlag)
19,99