Ultra Low Noise CMOS Image Sensors
Springer International Publishing (Verlag)
978-3-319-88657-2 (ISBN)
This thesis provides a thorough noise analysis for conventional CIS readout chains, while also presenting and discussing a variety of noise reduction techniques that allow the read noise in standard processes to be optimized. Two physical implementations featuring sub-0.5-electron RMS are subsequently presented to verify the proposed noise reduction techniques and provide a full characterization of a VGA imager. Based on the verified noise calculation, the impact of the technology downscaling on the input-referred noise is also studied.
Further, the thesis covers THz CMOS image sensors and presents an original design that achieves ultra-low-noise performance. Last but not least, it provides a comprehensive review of CMOS image sensors.
Introduction.- Low-Noise CMOS Image Sensors.- Noise Sources and Mechanisms in CIS.- Detailed Noise Analysis in Low-Noise CMOS Image Sensors.- Noise Reduction in CIS Readout Chains.- Design of a Sub-electron Readout Noise Pixel in a Standard CIS Process.- Characterization of a Sub-electron Readout Noise VGA Imager in a Standard CIS Process.- A Passive Switched-Capacitor Circuit For Correlated Multiple Sampling.- Downscaling Effects Towards Photon Counting Capability in CIS.- An Ultra Low Noise CMOS THz Imager.- Conclusion.
Erscheint lt. Verlag | 4.9.2018 |
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Reihe/Serie | Springer Theses |
Zusatzinfo | XIV, 180 p. 110 illus., 69 illus. in color. |
Verlagsort | Cham |
Sprache | englisch |
Maße | 155 x 235 mm |
Gewicht | 308 g |
Themenwelt | Mathematik / Informatik ► Informatik |
Technik ► Elektrotechnik / Energietechnik | |
Schlagworte | CMOS integrated circuits • Low light • Low Noise CMOS THz Imager • Noise Reduction Mechanism • Noise Source in CIS • N-path Filter • Photon Counting • Read Noise • Readout Circuit 1/f • switched capacitor • Thermal Noise Reduction • VGA Imager |
ISBN-10 | 3-319-88657-6 / 3319886576 |
ISBN-13 | 978-3-319-88657-2 / 9783319886572 |
Zustand | Neuware |
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