Low-Power CMOS Digital Pixel Imagers for High-Speed Uncooled PbSe IR Applications

Buch | Hardcover
XXI, 173 Seiten
2017 | 1st ed. 2017
Springer International Publishing (Verlag)
978-3-319-49961-1 (ISBN)

Lese- und Medienproben

Low-Power CMOS Digital Pixel Imagers for High-Speed Uncooled PbSe IR Applications - Josep Maria Margarit
106,99 inkl. MwSt

This book describes the development of a new low-cost medium wavelength IR (MWIR) monolithic imager technology for high-speed uncooled industrial applications. It takes the baton on the latest technological advances in the field of vapor phase deposition (VPD) PbSe-based MWIR detection accomplished by the industrial partner NIT S.L., adding fundamental knowledge on the investigation of novel VLSI analog and mixed-signal design techniques at circuit and system levels for the development of the readout integrated device attached to the detector. In order to fulfill the operational requirements of VPD PbSe, this work proposes null inter-pixel crosstalk vision sensor architectures based on a digital-only focal plane array (FPA) of configurable pixel sensors. Each digital pixel sensor (DPS) cell is equipped with fast communication modules, self-biasing, offset cancellation, analog-to-digital converter (ADC) and fixed patternnoise (FPN) correction. In-pixel power consumption is minimized by the use of comprehensive MOSFET subthreshold operation.

Introduction.- Frame-Based Smart IR Imagers.- Frame-Free Compact-Pitch IR Imagers.- Pixel Test Chips in 0.35mm and 0.15mm CMOS Technologies.- Imager Test Chips in 2.5mm, 0.35mm and 0.15mm CMOS Technologies.- Conclusions.

Erscheinungsdatum
Reihe/Serie Springer Theses
Zusatzinfo XXI, 173 p. 105 illus., 4 illus. in color.
Verlagsort Cham
Sprache englisch
Maße 155 x 235 mm
Themenwelt Informatik Theorie / Studium Künstliche Intelligenz / Robotik
Naturwissenschaften Physik / Astronomie Festkörperphysik
Technik Elektrotechnik / Energietechnik
Schlagworte CMOS Readout Integrated Circuits (ROICs) • computer vision • Digital Pixel Sensor (DPS) • Electronics and Microelectronics, Instrumentation • Electronics engineering • Engineering • Engineering: general • Event-driven Imagers • Fixed-pattern Noise (FPN) Calibration • High-speed MWIR Imagers • Image Processing • image processing and computer vision • Low-power Mixed-signal VLSI Design • Monolithic Image Sensors • Solid state physics • Spectrum analysis, spectrochemistry, mass spectrom • Uncooled Photonic Sensors • Vapour Phase Deposition (VPD) PbSe
ISBN-10 3-319-49961-0 / 3319499610
ISBN-13 978-3-319-49961-1 / 9783319499611
Zustand Neuware
Haben Sie eine Frage zum Produkt?
Mehr entdecken
aus dem Bereich
von absurd bis tödlich: Die Tücken der künstlichen Intelligenz

von Katharina Zweig

Buch | Softcover (2023)
Heyne (Verlag)
20,00