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Testing and Diagnosis of Analog Circuits and Systems
Kluwer Academic Publishers (Verlag)
978-0-442-25932-7 (ISBN)
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These efforts have led to some important findings, but are still not at the point of being practicaIly useful. However, these situations are now changing. The current trend for the design of VLSI chips is to use analog/digital hybrid circuits, instead of digital circuits from the past. Therefore, even Ix x Preface though the analog circuit may be small, the total circuit under testing is large.
1. A Circuit Theoretic Approach to Analog Fault Diagnosis.- Background.- An Introduction to Analog Fault Diagnosis.- Important Issues of Analog Fault Diagnosis.- The Element-Value Solvability Problem.- A Fault/Tolerance Compensation Model.- k-Fault Diagnosis: The Ideal Case.- k-Fault Diagnosis: The Tolerance Case.- Illustrative Examples.- 2. Linear Method vs. Nonlinear Method.- Setting of the Problem.- Probability.- Probability Measure.- Perturbation of Parameters.- Geometry of SF and TF.- Linear Method Is as Powerful as the Nonlinear Method.- 3. Topological Testability Conditions for Analog Fault Diagnosis.- Theory.- Applications.- 4. Fault Diagnosis of Nonlinear Electronic Circuits.- Fault Diagnosis of Linear Circuits.- Fault Diagnosis of PWL Circuits.- Examples.- 5. Analog Multifrequency Fault Diagnosis with the Assumption of Limited Failures.- The CCM and the Fault Diagnosis Equations of [4].- A Motivational Example.- Diagnosability for nf Faults.- Limited Fault Algorithm.- Limited Fault Algorithm Examples.- 6. A Searching Approach Self-Testing Algorithm for Analog Fault Diagnosis.- Automatic Test Program Generation.- Decision Algorithms.- The Heuristic Algorithm.- Parallel Processing for Analog Fault Diagnosis.- Design for Testability.- 7. An Artificial Intelligence Approach to Analog Systems Diagnosis.- Qualitative Causal Models.- The Treatment of Fault Probabilities.- Best Test Strategies.- FIS: An Implemented Diagnostic System.- Current Applications of FIS.- 8. Automatic Testing for Control Systems Conformance.- Historical Development of ATE.- Transfer Function Testing.- Return Signal Processing.- Tuning of Large Electro-Mechanical Servosystems.- The SUT Test Signature.- Transfer Function Models of Control Systems.- The "Fuzzy" Nature of Control System Behavior.- Checkout Based on Quadratic Performance Criteria.- "Closed Loop" Testing.- 9. Testing of Analog Integrated Circuits.- Testing vs. Diagnosis.- Digital vs. Analog Testing.- Specification-Based Testing.- Solution of the Test Tolerance Assignment Problem.- Consideration for Fault-Model-Based Testing.- An Approach to Fault-Model-Based Testing.- 10. A Unified Theory on Test Generation for Analog/Digital Systems.- Notation and Basic Concepts.- Testability of Interconnected Systems.- Reachability, Observability, and Testability.- Test Generation for Interconnected Systems: Case Studies.
Zusatzinfo | 2 black & white illustrations, biography |
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Verlagsort | Dordrecht |
Sprache | englisch |
Maße | 156 x 234 mm |
Gewicht | 550 g |
Themenwelt | Mathematik / Informatik ► Informatik |
ISBN-10 | 0-442-25932-8 / 0442259328 |
ISBN-13 | 978-0-442-25932-7 / 9780442259327 |
Zustand | Neuware |
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