Compact Models and Performance Investigations for Subthreshold Interconnects
Springer, India, Private Ltd (Verlag)
978-81-322-2131-9 (ISBN)
Dr. Rohit Dhiman received his B.Tech. Degree in Electronics & Communication Engineering from H.P.U. Shimla, India in 2007. He did his M.Tech. in VLSI Design Automation & Techniques, from National Institute of Technology (NIT) Hamirpur, India in 2009. He was awarded his Ph.D. Degree from NIT Hamirpur in 2014. He has also worked as Post-Doctoral Researcher at Indian Institute of Technology (IIT) Ropar, India. Presently Dr. Rohit Dhiman has been working as an Assistant Professor at NIT Hamirpur. He has over 20 research papers in international journals of repute and conferences to his credit. His research interest is in device and circuit modeling for low power VLSI design. Dr. Rajeevan Chandel received her B.E. Degree in E&CE from Thapar Institute of Engg. & Technology, Patiala, India in 1990. She is a double gold medalist of Himachal Pradesh University, Shimla in Pre-Univ and Pre-Engg. She did her M.Tech. in Integrated Electronics and Circuits, from IIT Delhi in 1997. She was awarded Ph.D. Degree from IIT Roorkee, India in 2005. Dr. Chandel joined Dept. of E&CE, NIT, Hamirpur, HP as Lecturer in 1990, where presently she is working as Professor & Head. She has over 40 research papers in international journals of repute and over 90 in conferences. Her research interest is in electronics circuit modeling and low power VLSI design. She is a life member of IETE (I) and ISTE (I) and member of VSI.
Introduction.- Design Challenges in Sub-threshold Interconnect Circuits.- Sub-threshold Interconnect Circuit Design.- Characterization of Dynamic Crosstalk Effect In Sub-threshold Interconnects.- Sub-threshold Interconnect Noise Analysis.- Variability in Sub-threshold Interconnects.
Reihe/Serie | Energy Systems in Electrical Engineering |
---|---|
Zusatzinfo | 45 Illustrations, black and white; XIII, 113 p. 45 illus. |
Verlagsort | New Delhi |
Sprache | englisch |
Maße | 155 x 235 mm |
Themenwelt | Mathematik / Informatik ► Informatik |
Technik ► Elektrotechnik / Energietechnik | |
Schlagworte | Crosstalk • On-Chip Interconnects • Sub-threshold • Variability • Very Large Scale Integration (VLSI) |
ISBN-10 | 81-322-2131-1 / 8132221311 |
ISBN-13 | 978-81-322-2131-9 / 9788132221319 |
Zustand | Neuware |
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