Theory of CMOS Digital Circuits and Circuit Failures (eBook)

(Autor)

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2014
590 Seiten
Princeton University Press (Verlag)
978-1-4008-6284-9 (ISBN)

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Theory of CMOS Digital Circuits and Circuit Failures - Masakazu Shoji
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CMOS chips are becoming increasingly important in computer circuitry. They have been widely used during the past decade, and they will continue to grow in popularity in those application areas that demand high performance. Challenging the prevailing opinion that circuit simulation can reveal all problems in CMOS circuits, Masakazu Shoji maintains that simulation cannot completely remove the often costly errors that occur in circuit design. To address the failure modes of these circuits more fully, he presents a new approach to CMOS circuit design based on his systematizing of circuit design error and his unique theory of CMOS digital circuit operation. In analyzing CMOS digital circuits, the author focuses not on effects originating from the characteristics of the device (MOSFET) but on those arising from their connection. This emphasis allows him to formulate a powerful but ultimately simple theory explaining the effects of connectivity by using a concept of the states of the circuits, called microstates. Shoji introduces microstate sequence diagrams that describe the state changes (or the circuit connectivity changes), and he uses his microstate theory to analyze many of the conventional CMOS digital circuits. These analyses are practically all in closed-form, and they provide easy physical interpretation of the circuit's working mechanisms, the parametric dependence of performance, and the circuit's failure modes.Originally published in 1992.The Princeton Legacy Library uses the latest print-on-demand technology to again make available previously out-of-print books from the distinguished backlist of Princeton University Press. These editions preserve the original texts of these important books while presenting them in durable paperback and hardcover editions. The goal of the Princeton Legacy Library is to vastly increase access to the rich scholarly heritage found in the thousands of books published by Princeton University Press since its founding in 1905.
Erscheint lt. Verlag 14.7.2014
Reihe/Serie Princeton Legacy Library
Verlagsort Princeton
Sprache englisch
Themenwelt Mathematik / Informatik Mathematik
Technik
Schlagworte Analogue Electronics • Biasing • bipolar junction transistor • Buffer amplifier • Call gate (Intel) • capacitance • Capacitive coupling • capacitor • Characteristic impedance • Circuit Design • Circuit diagram • circuit switching • CMOS • Common-mode rejection ratio • Computer performance • Contact resistance • Data Transmission • DC bias • Depletion and enhancement modes • dielectric • differential amplifier • Digital Data • Digital electronics • digital signal • digital signal processing • Diode • distortion • Doping (semiconductor) • Dynamic logic (digital electronics) • Electrical Breakdown • Electrical phenomena • Electrical resistivity and conductivity • Electronic Circuit • Emitter-coupled logic • Equivalent Circuit • Extrinsic semiconductor • Failure analysis • field-effect transistor • Frequency mixer • Gain (electronics) • Gate oxide • Impedance Matching • Inductance • input impedance • Insulator (electricity) • Integrated circuit • Integrated Circuit Design • Ionized impurity scattering • Latch (hardware) • Linear Amplifier • logic gate • Logic level • Logic Optimization • Material failure theory • Memory cell (binary) • Memory effect • Negative feedback amplifier • Network analysis (electrical circuits) • Noise (electronics) • Noise measurement • Operational amplifier • Oscillation • output impedance • parasitic capacitance • Passivity (engineering) • polycrystalline silicon • Power Factor • Power Inverter • Power supply • Process variation (semiconductor) • Quantization (signal processing) • Random logic • RC circuit • resistor • Ring Oscillator • semiconductor • Sequential Logic • Series and Parallel Circuits • Signal (electrical engineering) • signal-to-noise ratio • Silicon • Silicon On Insulator • Slew Rate • Technology • Three-dimensional integrated circuit • Threshold Voltage • Timing failure • Transconductance • Transformer • Transistor • Transmission Gate • Transmission Line • Voltage Divider • voltage drop • Voltage Reference • Voltage Regulation • Voltage source • Voltage spike • Wafer (electronics) • waveform
ISBN-10 1-4008-6284-1 / 1400862841
ISBN-13 978-1-4008-6284-9 / 9781400862849
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