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Advances in Imaging and Electron Physics

Buch | Hardcover
415 Seiten
1996
Academic Press Inc (Verlag)
978-0-12-014737-3 (ISBN)
185,80 inkl. MwSt
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This volume presents extended articles on: the physics of electron devices, particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propogation, electron microscopy, and the computing methods used in all these domains.
Advances in Imaging and Electron Physics is the merger of two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical & Electron Microscopy. It features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computingmethods used in all these domains.

Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 – 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.

L. Lambert and T. Mulvey, Ernst Ruska (1906–1988), Designer Extraordinaire of the Electron Microscope: A Memoir. V.T. Binh, N. Garcia, and S.T. Purcell, Electron Field Emission from Atom-Sources: Fabrication, Properties, and Applications of Nanotips. P.L. Combettes, The Convex Feasibility Problem in Image Recovery. C. Doran, A. Lasenby, S. Gull, S. Somaroo, and A. Challinor, Spacetime Algebra and Electron Physics. H.C. Shen and D. Srivastava,Texture Representation and Classification: The Feature Frequency Matrix Approach. Chapter References. Subject Index.

Erscheint lt. Verlag 14.3.1996
Reihe/Serie Advances in Imaging and Electron Physics
Mitarbeit Chef-Herausgeber: Peter W. Hawkes
Herausgeber (Serie): Benjamin Kazan, Peter W. Hawkes
Verlagsort San Diego
Sprache englisch
Maße 152 x 229 mm
Gewicht 790 g
Themenwelt Informatik Grafik / Design Digitale Bildverarbeitung
Technik Elektrotechnik / Energietechnik
ISBN-10 0-12-014737-8 / 0120147378
ISBN-13 978-0-12-014737-3 / 9780120147373
Zustand Neuware
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