Signal Processing and Pattern Recognition in Nondestructive Evaluation of Materials
Springer Berlin (Verlag)
978-3-642-83424-0 (ISBN)
The NATO Advanced Research Workshop on Signal Processing and Pattern Recognition in Nondestructive Evaluation (NOE) of Materials was held August 19-22, 1987 at the Manoir St-Castin, Lac Beauport, Quebec, Canada. Modern signal processing, pattern recognition and artificial intelligence have been playing an increasingly important role in improving nondestructive evaluation and testing techniques. The cross fertilization of the two major areas can lead to major advances in NOE as well as presenting a new research area in signal processing. With this in mind, the Workshop provided a good review of progress and comparison of potential techniques, as well as constructive discussions and suggestions for effective use of modern signal processing to improve flaw detection, classification and prediction, as well as material characterization. This Proceedings volume includes most presentations given at the Workshop. This publication, like the meeting itself, is unique in the sense that it provides extensive interactions among the interrelated areas of NOE. The book starts with research advances on inverse problems and then covers different aspects of digital waveform processing in NOE and eddy current signal analysis. These are followed by four papers of pattern recognition and AI in NOE, and five papers of image processing and reconstruction in NOE. The last two papers deal with parameter estimation problems. Though the list of papers is not extensive, as the field of NOE signal processing is very new, the book has an excellent collection of both tutorial and research papers in this exciting new field.
Research on Inverse Problems.- 1. "Research inverse problems in materials science and engineering".- 2. "Advances in Born inversion".- Digital Waveform Processing in NDE.- 3. "Modern signal processing".- 4. "A split spectrum processing method of scatterer density estimation".- 5. "Spectral and spatial processing techniques for improved ultrasonic imaging of materials".- 6. "Signal processing of ultrasonic backscattered echoes for evaluating the microstructure of materials - a review".- 7. "High resolution deconvolution of ultrasonic traces".- 8. "Nondestructive evaluation in the time-frequency domain by means of the Wigner-Ville distribution".- 9. "Pulse shaping and extraction of information from ultrasonic reflections in composite materials".- Eddy Current Signal Analysis.- 10. "Signal processing for eddy current nondestructive evaluation".- 11. "Eddy current modeling and signal processing in NDE".- Pattern Recognition and ai in NDE.- 12. "High resolution spectral analysis NDE techniques for flaw characterization prediction and discrimination".- 13. "Automated ultrasonic system for submarine pressure hull inspection".- 14. "Pattern recognition of ultrasonic signals for detection of wall thinning".- 15. "Knowledge based systems in nondestructive evaluation".- 3-D and 2-D Signal Analysis in NDE.- 16. "Limited-angle image reconstruction in nondestructive evaluation".- 17. "The effects of limited data in multi-frequency reflection diffraction tomography".- 18. "A 3-D image segmentation algorithm".- 19. "Processing of thermal images for the detection and enhancement of subsurface flaws in composite materials".- 20. "Laplacian pyramid image data compression using vector quantization".-Parameter Estimation Consideration.- 21. "Parameter estimation in array processing".- 22. "Role of peak detection and parameter estimation in nondestructive testing of materials".- List of Participants.
| Erscheint lt. Verlag | 19.1.2012 |
|---|---|
| Reihe/Serie | NATO ASI Subseries F: |
| Zusatzinfo | VIII, 344 p. |
| Verlagsort | Berlin |
| Sprache | englisch |
| Maße | 170 x 244 mm |
| Gewicht | 620 g |
| Themenwelt | Informatik ► Weitere Themen ► CAD-Programme |
| Schlagworte | algorithms • Artificial Intelligence • Cognition • Complexity • Construction • Image Processing • Image Segmentation • Intelligence • Knowledge • knowledge base • Modeling • pattern recognition • proving |
| ISBN-10 | 3-642-83424-8 / 3642834248 |
| ISBN-13 | 978-3-642-83424-0 / 9783642834240 |
| Zustand | Neuware |
| Haben Sie eine Frage zum Produkt? |
aus dem Bereich
