Advances in Imaging and Electron Physics (eBook)

Cover 1
Advances in Imaging and Electron Physics 4
Copyright Page 5
Contents 6
Contributors 10
Preface 12
Future Contributions 14
Chapter 1. An Algebraic Approach to Subband Signal Processing 18
I. Introduction 18
II. An Overview of Recursive Matrices 21
III. Recursive Operators of Filter Theory 30
IV. More Algebraic Results 39
V. Analysis and Synthesis Filter Banks 47
VI. M-Channel Filter Bank Systems 54
VII. Transmultiplexers 61
VIII. The M-Band Lifting 65
IX. Conclusion 77
References 78
Chapter 2. Determining the Locations of Chemical Species in Ordered Compounds: ALCHEMI 80
I. Background 80
II. Fundamentals 81
III. ALCHEMI Results 94
IV. Predicting Sublattice Occupancies 117
V. Competing (or Supplementary) Techniques 119
VI. Summary 123
VII. Current Challenges and Future Directions (a Personal View) 123
References 124
Chapter 3.Aspects of Mathematical Morphology 136
I. Introduction 137
II. Integral Geometry: Theory 139
III. Integral Geometry in Practice 158
IV. Illustrative Examples 166
V. Computer Tomography Images of Metal Foams 187
VI. Summary 193
Appendix A: Algorithm 193
Appendix B: Programming Example (Fortran 90) 195
Appendix C: Derivation of Eq. (36) 199
Appendix D: Proof of Eq. (56) 201
Appendix E: Proof of Eq. (57) 205
References 207
Chapter 4.Ultrafast Scanning Tunneling Microscopy 212
I. Introduction 212
II. History 213
III. Ultrafast Scanning Probe Microscopy 216
IV. Junction Mixing STM 222
V. Distance Modulated STM 233
VI. Photo-Gated STM 235
VII. Ultrafast STM by Direct Optical Coupling to the Tunnel Junction 242
VIII. Conclusions 245
References 245
Chapter 5.Low-Density Parity-Check Codes„A Statistical Physics Perspective 248
I. Introduction 249
II. Coding and Statistical Physics 254
III. Sourlas Codes 269
IV. Gallager Codes 287
V. MacKay–Neal Codes 308
VI. Cascading Codes 335
VII. Conclusions and Perspectives 342
Appendix A. Sourlas Codes: Technical Details 344
Appendix B. Gallager Codes: Technical Details 354
Appendix C. MN Codes: Technical Details 358
References 365
Chapter 6.Computer-Aided Crystallographic Analysis in the TEM 372
I. Introduction 373
II. Electron Diffraction and Diffraction Contrast 375
III. A Universal Procedure for Orientation Determination from Electron Diffraction Patterns 386
IV. Automation of Orientation Determination in TEM 394
V. Characterization of Grain Boundaries 408
VI. Determination of Slip Systems 414
VII. Phase and Lattice Parameter Determination 420
VIII. Calibration 425
IX. Conclusions 428
References 430
Index 434