Low Power and Process Variation Aware SRAM and Cache Design
Seiten
2015
|
2015 ed.
Springer-Verlag New York Inc.
978-1-4614-2271-6 (ISBN)
Springer-Verlag New York Inc.
978-1-4614-2271-6 (ISBN)
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Low Power and Process Variation Aware SRAM and Cache Design
This book addresses process variability and power management for embedded memories, which are becoming dominant components in today's Systems on Chip (SoCs). It provides thorough background on voltage scaling and the reliability effects on memories, while describing memory behavior at different voltages and frequencies. The authors describe a cross-layer approach, simultaneously targeting the manufacturing of devices, the inner-design of the memory circuits, as well as the way they are architected into a system. This approach enables the design of reliable, power-efficient systems in which memories are dominating area, power, and performance.
This book addresses process variability and power management for embedded memories, which are becoming dominant components in today's Systems on Chip (SoCs). It provides thorough background on voltage scaling and the reliability effects on memories, while describing memory behavior at different voltages and frequencies. The authors describe a cross-layer approach, simultaneously targeting the manufacturing of devices, the inner-design of the memory circuits, as well as the way they are architected into a system. This approach enables the design of reliable, power-efficient systems in which memories are dominating area, power, and performance.
Introduction.- SCPS Cache.- RDC-Cache.- IDC-Cache.- VTD-Cache.- Conclusions.
Erscheint lt. Verlag | 1.12.2015 |
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Zusatzinfo | 100 black & white illustrations, biography |
Verlagsort | New York, NY |
Sprache | englisch |
Maße | 155 x 235 mm |
Themenwelt | Mathematik / Informatik ► Informatik ► Theorie / Studium |
Informatik ► Weitere Themen ► Hardware | |
Technik ► Elektrotechnik / Energietechnik | |
Schlagworte | Embedded Memory Design • Fault tolerant memory design • Low Power Memory Design • Memory Circuit Design • Niederspannung • Process Variation Aware SRAM • SRAM design • SRAM (Static Random Access Memory) • System on chip • System-on-Chip (SoC) • Voltage scalable SRAM/Cache architectures |
ISBN-10 | 1-4614-2271-X / 146142271X |
ISBN-13 | 978-1-4614-2271-6 / 9781461422716 |
Zustand | Neuware |
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