Computing Science and Statistics -

Computing Science and Statistics

Statistics of Many Parameters: Curves, Images, Spatial Models

Connie Page, Raoul LePage (Herausgeber)

Buch | Softcover
583 Seiten
1991 | Softcover reprint of the original 1st ed. 1992
Springer-Verlag New York Inc.
978-0-387-97719-5 (ISBN)
106,99 inkl. MwSt
Interface '90 is the continuation of an ext!remely successful symposium series. The series has provided a forum for the interaction of professionals in statistics, computing science, and in numerical methods, wherein they may discuss a wide range of topics at the interface of these disciplines. This, the 22nd Symposium on the Interface: Computing Science and Statistics, was held 16-19 May, 1990 at the Kellogg Center on the campus of Michigan State University and is the third Symposium to be held under the recently organized Interface Foundation of North America. The Interface Board of Directors consists of the nine most recent Symposium Chairs: James E. Gentle, Lynne Billard, David M. Allen, Thomas J. Boardman, Richard M. Heiberger, Edward J. Wegman, Linda Malone, Raoul LePage, and Jon Kettenring. The officers of the Interface are William Eddy, Board Chairman and Executive Director; Edward Wegman, President and Treasurer; Lynne Billard, Secretary. My valued colleague Connie Page, Editor of this Proceedings Volume and generally bright and hardworking person, has organizational skills of a higher order which were successfully brought into play during many critical junctures not strictly connected with the Proceedings. Edward Wegman, Barbara Barringer, Bill Eddy, and George Styan all pitched in with useful information on numerous occasions. Our Keynote Speaker, Peter G. Hall and Plenary Speakers David L. Donoho, Jerome H. Friedman (who also gave a short course), Bruce Hajek, John Skilling, and C. F.

Keynote Address.- Plenary Addresses.- Invited Papers Bayesian Computation.- Software Quality and Reliability.- Constrained Least Squares.- Small Sample Performance of Computer Intensive Statistical Methods.- Curve and Density Estimation.- Graphical Techniques for Analyzing Data.- Breaking out of 2-D Cartesian Coordinates.- Nonparametric Regression.- Spatial Statistics and Image Reconstruction.- Neural Network Computations.- Bayesian Applications.- Modern APL.- Neural Networks and Related Techniques.- Nonlinear and Spatical Time Series.- Nonparametric Data Analysis.- Software Metrics.- Algorithmic Statistical Process Control.- Contributed Papers.

Zusatzinfo 4 Illustrations, black and white; XIII, 583 p. 4 illus.
Verlagsort New York, NY
Sprache englisch
Maße 210 x 279 mm
Themenwelt Mathematik / Informatik Mathematik Angewandte Mathematik
Mathematik / Informatik Mathematik Statistik
Mathematik / Informatik Mathematik Wahrscheinlichkeit / Kombinatorik
ISBN-10 0-387-97719-8 / 0387977198
ISBN-13 978-0-387-97719-5 / 9780387977195
Zustand Neuware
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