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CAD-Programm (AutoCAD, CATIA, u.a.)

Closing the Gap between RTL and ESL
von Michael Synopsys Fellow Keating
Buch | Softcover
2014 | Springer-Verlag New York Inc.
ISBN: 9781489998163
106,99 (inkl. MwSt)
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Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies
von Alberto Bosio; Luigi Dilillo; Patrick Girard;..
Buch | Softcover
2014 | Springer-Verlag New York Inc.
ISBN: 9781489983145
109,99 (inkl. MwSt)
in den Warenkorb
  • Versand in 10-14 Tagen