Materials Science in Microelectronics II
The Effects of Structure on Properties in Thin Films
Seiten
2005
|
2nd edition
Elsevier Science Ltd (Verlag)
978-0-08-044639-4 (ISBN)
Elsevier Science Ltd (Verlag)
978-0-08-044639-4 (ISBN)
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Looks at the importance of thin films to microelectronic development. This title examines the effect of structure on: electrical properties; magnetic properties; optical properties; mechanical properties; mass transport properties; interface and junction properties; defects and properties.
The subject matter of thin-films – which play a key role in microelectronics – divides naturally into two headings: the processing / structure relationship, and the structure / properties relationship. Part II of 'Materials Science in Microelectronics' focuses on the latter of these relationships, examining the effect of structure on the following: •Electrical properties•Magnetic properties•Optical properties•Mechanical properties•Mass transport properties•Interface and junction properties•Defects and properties
The subject matter of thin-films – which play a key role in microelectronics – divides naturally into two headings: the processing / structure relationship, and the structure / properties relationship. Part II of 'Materials Science in Microelectronics' focuses on the latter of these relationships, examining the effect of structure on the following: •Electrical properties•Magnetic properties•Optical properties•Mechanical properties•Mass transport properties•Interface and junction properties•Defects and properties
Erscheint lt. Verlag | 29.11.2005 |
---|---|
Verlagsort | Oxford |
Sprache | englisch |
Maße | 152 x 229 mm |
Gewicht | 510 g |
Themenwelt | Technik ► Elektrotechnik / Energietechnik |
ISBN-10 | 0-08-044639-6 / 0080446396 |
ISBN-13 | 978-0-08-044639-4 / 9780080446394 |
Zustand | Neuware |
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