Indexing of Crystal Diffraction Patterns - Adam Morawiec

Indexing of Crystal Diffraction Patterns

From Crystallography Basics to Methods of Automatic Indexing

(Autor)

Buch | Softcover
XX, 418 Seiten
2023 | 1st ed. 2022
Springer International Publishing (Verlag)
978-3-031-11079-5 (ISBN)
160,49 inkl. MwSt
This book provides a detailed, self-contained description of automatic indexing of crystal diffraction patterns, considering both ab initio indexing and indexing of patterns originating from known structures. Introductory chapters equip the reader with the necessary basic knowledge of geometric crystallography, as well as kinematic and dynamic theories of crystal diffraction. Subsequent chapters delve and describe ab initio indexing of single crystal diffraction patterns and indexing of patterns for orientation determination. The book also reviews methods of indexing powder diffraction and electron spot-type patterns, as well the subject of multigrain indexing. Later chapters are devoted to diffraction by helical structures and quasicrystals, as well as some aspects of lattice parameter refinement and strain determination.
The book is intended equally for materials scientists curious about 'nuts and bolts' of diffraction pattern indexing and orientation mapping systems, as well as interdisciplinary researchers from physics, chemistry, and biology involved in crystallographic computing. It provides a rigorous, yet accessible, treatment of the subject matter for graduate students interested in understanding the functioning of diffraction pattern indexing engines.

Adam Morawiec is currently employed as a professor at the Institute of Metallurgy and Materials Science, part of the Polish Academy of Sciences. His research focuses on anisotropic structures, crystallographic textures of polycrystalline materials, formal description of properties of such materials and on computational issues related to the investigation of textures and microstructures. He is the author of the 2004 Springer book, "Orientations and Rotations: Computations in Crystallographic Textures", and has close to 120 publications on the topics of ab initio indexing, indexing for orientation determination, other aspects of orientation determination and orientation mapping, and diffraction-based determination of local lattice strains.

Geometric crystallography.- Basic aspects of crystal diffraction.- Diffraction of high energy electrons.- Cartesian reference frames in diffractometry.- Indexing of single crystal diffraction patterns.- Ab-inito indexing of Laue patterns.- Indexing of powder diffraction patterns.- Indexing for orientation determination.- Indexing of spot-type diffraction patterns.- Complications in indexing.- Multigrain indexing.- Beyond diffraction by periodic crystals.- Quasicrystals.- Strain determination

Erscheinungsdatum
Reihe/Serie Springer Series in Materials Science
Zusatzinfo XX, 418 p. 148 illus.
Verlagsort Cham
Sprache englisch
Maße 155 x 235 mm
Gewicht 742 g
Themenwelt Naturwissenschaften Chemie Analytische Chemie
Naturwissenschaften Physik / Astronomie Atom- / Kern- / Molekularphysik
Technik Maschinenbau
Schlagworte Ab Initio Indexing of Diffraction Patterns • Ab Initio Indexing of Laue Patterns • Crystallographic Computing • Diffraction Patterns of Quasicrystals • Direct Pattern Matching • High Energy Electron Diffraction • Indexing for Orientation Determination • Indexing of Powder Diffraction Patterns • Multigrain Indexing • Single Crystal Diffraction • Spot-Type Diffraction Patterns • Three-Dimensional Ab-Initio Indexing • Three-Dimensional Fourier Transformation • X-Ray Diffraction Strain Determination
ISBN-10 3-031-11079-X / 303111079X
ISBN-13 978-3-031-11079-5 / 9783031110795
Zustand Neuware
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