Si Detectors and Characterization for HEP and Photon Science Experiment (eBook)

How to Design Detectors by TCAD Simulation
eBook Download: PDF
2019 | 1st ed. 2019
XVII, 183 Seiten
Springer International Publishing (Verlag)
978-3-030-19531-1 (ISBN)

Lese- und Medienproben

Si Detectors and Characterization for HEP and Photon Science Experiment - Ajay Kumar Srivastava
Systemvoraussetzungen
96,29 inkl. MwSt
  • Download sofort lieferbar
  • Zahlungsarten anzeigen

This book reviews the HL-LHC experiments and the fourth-generation photon science experiments, discussing the latest radiation hardening techniques, optimization of device & process parameters using TCAD  simulation tools, and the experimental characterization required to develop rad-hard Si detectors for x-ray induced surface damage and bulk damage by hadronic irradiation.

Consisting of eleven chapters, it introduces various types of strip and pixel detector designs for the current upgrade, radiation, and dynamic range requirement of the experiments, and presents an overview of radiation detectors, especially Si detectors. It also describes the design of pixel detectors, experiments and characterization of Si detectors.

The book is intended for researchers and master's level students with an understanding of radiation detector physics. It provides a concept that uses TCAD simulation to optimize the electrical performance of the devices used in the harsh radiation environment of the colliders and at XFEL.




Ajay Srivastava received his Ph.D. degree in Experimental High Energy Physics 'Development of Si strip detector for the ECAL of the CMS Experiment at CERN, Geneva' at the Department of Physics, University of Delhi and Helsinki Institute of Physics, University of Helsinki, Finland. Thereafter, he worked as a Postdoctoral fellow at the Institute for Experimental Physics, University of Hamburg on two prestigious projects in Germany DESY with Professor Dr. Robert Klanner at DESY; 'short strip p+n detector for inner tracking of CMS tracker upgrade'  and ' x-ray p+n pixel detector for the European XFEL'. He was a visiting scientist at CERN, Geneva from (2008-2010). He then did a second postdoctoral work 'development of DSSD for Belle2' at the Tata Institute of Fundamental Research (TIFR), Mumbai with Prof. Tariq Aziz. In 2012, he worked as a Senior Scientist at FEI Company (now Thermo Fisher Scientific Instruments), USA. 

Ajay is currently a full Professor (Physics) at Chandigarh University involved in the research & development of p+n strip detectors for the phase-2 upgrade of the CMS tracker upgrade for the HL-LHC (2026) and x ray p+n pixel detector for the next generation photon science experiments. He has received several awards, fellowships and honors, such as a CIMO Fellow, UGC, New Delhi, DST (RA, Scientist), Govt. India, Industrial Resident, IMEC, Belgium, DAE RA-3 Honorarium, TIFR, Mumbai, just to mention a few. 

His research is published in more than 73 international peer reviewed research Journals. He is a referee  international journals and an editorial member of Medcrave, USA (OAJNP) & worked in the International European Experiments (CMS CERN, CEC CMS) & CERN RD50 Collaborations.

 

Erscheint lt. Verlag 13.9.2019
Zusatzinfo XVII, 183 p. 106 illus., 77 illus. in color.
Sprache englisch
Themenwelt Informatik Weitere Themen CAD-Programme
Naturwissenschaften Physik / Astronomie Atom- / Kern- / Molekularphysik
Technik Maschinenbau
Schlagworte CERN RD50 collaboration • CMS detector • designing pixel detectors • High Luminosity Large Hadron Collider experiments • high precision radiation hard detectors • LHC • pixel sensors • semiconductor radiation detectors • Si pixel detector • surface radiation design • TCAD
ISBN-10 3-030-19531-7 / 3030195317
ISBN-13 978-3-030-19531-1 / 9783030195311
Haben Sie eine Frage zum Produkt?
PDFPDF (Wasserzeichen)
Größe: 7,8 MB

DRM: Digitales Wasserzeichen
Dieses eBook enthält ein digitales Wasser­zeichen und ist damit für Sie persona­lisiert. Bei einer missbräuch­lichen Weiter­gabe des eBooks an Dritte ist eine Rück­ver­folgung an die Quelle möglich.

Dateiformat: PDF (Portable Document Format)
Mit einem festen Seiten­layout eignet sich die PDF besonders für Fach­bücher mit Spalten, Tabellen und Abbild­ungen. Eine PDF kann auf fast allen Geräten ange­zeigt werden, ist aber für kleine Displays (Smart­phone, eReader) nur einge­schränkt geeignet.

Systemvoraussetzungen:
PC/Mac: Mit einem PC oder Mac können Sie dieses eBook lesen. Sie benötigen dafür einen PDF-Viewer - z.B. den Adobe Reader oder Adobe Digital Editions.
eReader: Dieses eBook kann mit (fast) allen eBook-Readern gelesen werden. Mit dem amazon-Kindle ist es aber nicht kompatibel.
Smartphone/Tablet: Egal ob Apple oder Android, dieses eBook können Sie lesen. Sie benötigen dafür einen PDF-Viewer - z.B. die kostenlose Adobe Digital Editions-App.

Buying eBooks from abroad
For tax law reasons we can sell eBooks just within Germany and Switzerland. Regrettably we cannot fulfill eBook-orders from other countries.

Mehr entdecken
aus dem Bereich
Technologische Grundlagen und industrielle Praxis

von André Borrmann; Markus König; Christian Koch …

eBook Download (2021)
Springer Fachmedien Wiesbaden (Verlag)
89,99
Agilität kontinuierlich verbessern

von Irun D. Tosh

eBook Download (2024)
tredition (Verlag)
19,99