Migration Imaging of the Transient Electromagnetic Method

Xiu Li, Guoqiang Xue, Changchun Yin (Autoren)

Buch | Softcover

139 Seiten

2018 | Softcover reprint of the original 1st ed. 2017
Springer Verlag, Singapore
978-981-10-9688-4 (ISBN)

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This book is based on more than a decade of research the authors have pursued on the pseudo-seismic migration imaging of the transient electromagnetic method, and provides a series of important findings on the theory and applications in this area. It present and analyzes transforming principles, TEM wave field methods, characteristics of the TEM virtual wave field and studies on many significant related technologies. The coverage is supplemented by a wealth of 1-D, 2-D and 3-D figures to illustrate pseudo-seismic theory. The book offers a valuable resource for teachers, students, researchers and engineers in the fields of geophysics, earth exploration and information technology.

Xiu Li is a professor in Chang’an University. He is a committee member of the Electromagnetic Committee of Chinese Geophysical Society and chairman of the Committee of Shaanxi Geophysical Society and he is also the director of 6th and 7th council of Chinese Geophysical Society. Guoqiang Xue is a reseacher in Institute of Geology and Geophysics, Chinese Academy of Sciences. Moreover, he is standing committee of International Technology Committee of Chinese Geophysical Society and standing vice secretary-general of Engineering Geophysics of Chinese Geophysical Society. He is also editor of the Journal of Geophysics & Remote Sensing, Journal of Geology & Geoscience Sensing, Applied Geophysics and Progress of Geophysics.

Development and prospect of transient electromagnetic method.- Theory and technology of full-zone wave-field transformation.- Property of TEM Pseudo Wave-Field.- Synthetic Aperture Algorithms and Compression of Wavelet Width.- Surface Continuation and Imaging of TEM Based on Pseudo Wave Equations.- Velocity analysis of TEM pseudo wave field.- Imaging of Theoretical Model and field examples.

Erscheinungsdatum	18.08.2018
Zusatzinfo	67 Illustrations, color; 21 Illustrations, black and white; IX, 139 p. 88 illus., 67 illus. in color.
Verlagsort	Singapore
Sprache	englisch
Original-Titel	Shun bian dian ci fa ni di zhen pian yi cheng xiang yan jiu
Maße	155 x 235 mm
Themenwelt	Naturwissenschaften ► Biologie ► Ökologie / Naturschutz
	Naturwissenschaften ► Geowissenschaften ► Geologie
	Naturwissenschaften ► Geowissenschaften ► Geophysik
	Naturwissenschaften ► Physik / Astronomie ► Angewandte Physik
	Technik ► Umwelttechnik / Biotechnologie
Schlagworte	3D TEM imaging • Curved surface extension • Imaging calculation • Kirchhoff integral method • Pseudo-seismic field • Synthetic Aperture • TEM virtual wave field • Transient electromagnetic field • Wavefield transformation
ISBN-10	981-10-9688-0 / 9811096880
ISBN-13	978-981-10-9688-4 / 9789811096884
Zustand	Neuware