Hard X-ray Photoelectron Spectroscopy (HAXPES) -

Hard X-ray Photoelectron Spectroscopy (HAXPES)

Joseph Woicik (Herausgeber)

Buch | Softcover
XII, 571 Seiten
2018 | 1. Softcover reprint of the original 1st ed. 2016
Springer International Publishing (Verlag)
978-3-319-79572-0 (ISBN)
299,59 inkl. MwSt
This book provides the first complete and up-to-date summary of the state of the art in HAXPES and motivates readers to harness its powerful capabilities in their own research. The chapters are written by experts. They include historical work, modern instrumentation, theory and applications. This book spans from physics to chemistry and materials science and engineering. In consideration of the rapid development of the technique, several chapters include highlights illustrating future opportunities as well.

Overview.- Early Work and SSRP.- Instrumentation and Spin Resolved.- Theory.- Inelastic Mean Free Path.- Final State Effects.- Recoil Effects.- Atomic and Molecular.- Angle Resolved.- Valence Density of States.- Diffraction.- Advanced Materials.- Correlated Materials.- Perovskite Interfaces and Superlattices.- Heusler Compounds.- In-Situ Surface Chemistry.- Heterojunction Band Alignment.- Semiconductor Electronics.- Photoelectron Imaging.- Time Resolved.

Erscheinungsdatum
Reihe/Serie Springer Series in Surface Sciences
Zusatzinfo XII, 571 p. 279 illus., 180 illus. in color.
Verlagsort Cham
Sprache englisch
Maße 155 x 235 mm
Gewicht 884 g
Themenwelt Naturwissenschaften Chemie Analytische Chemie
Naturwissenschaften Physik / Astronomie Atom- / Kern- / Molekularphysik
Technik Maschinenbau
Schlagworte Atomic and Molecular Spectra • Correlated Materials • Hard X-ray Photoelectron Spectroscopy • HAXPES • Heterojunction Band Alignment • In Situ Surface Chemistry • Photoelectron Imaging • Spectroscopic Instrumentation • Theory of Photoelectron Spectroscopy • Time Resolved Imaging • Valence Density of States
ISBN-10 3-319-79572-4 / 3319795724
ISBN-13 978-3-319-79572-0 / 9783319795720
Zustand Neuware
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