X-Ray and Neutron Structure Analysis in Materials Science

Powder Diffraction Analysis.- Identification of X-ray Diffraction Patterns of Multicomponent Mixtures.- Quantitative Reference Intensity Analysis: Methodology and Means for Verification of Results.- Correction of Compositional Variability in the X-ray Diffraction Phase Analysis.- Dilution and Addition Methods in Quantitative X-ray Diffraction Phase Analysis.- Shape Memory Effect Analysis by X-ray Diffraction.- Formation of a Satellite Phase in the Neutron Irradiated Reactor Steel.- X-ray Phase Analysis of Cu and Pb Anodic Oxidation Products.- Phase Analysis of Rusts by X-ray Diffraction, IR-Spectroscopy and Thermal Analysis.- Dynamical X-ray Diffraction Study on the Phase Transformation in Rapidly Quenched Au71Sn29 Alloy.- Process Kinetics Studied by X-ray Diffraction.- X-ray Diffraction Analysis of 12 CaO. 7 Al2O3 Polymorphs.- X-ray Analysis of Mineral Substances of Blood Vessels.- Optical Diffraction of Computer Simulated Patterns of Transitions in Two Dimensional Regular Lattice.- Diffraction Analysis of Amorphous Materials, Glasses and Polymers.- Investigation of the Microscopic Mechanism of the High Strength of Amorphous Alloys.- Partial Structure Factors for Amorphous Fe75B25 Determined by Diffraction of Polarized Neutrons.- Neutron Diffraction Investigation of the Short-Range Atomic Order in Tellurite Glasses.- Supermolecular Structure of the “Ladder-Type” Styrene-Multimethacrylate Copolymers.- The Structure Evaluation of Polypropylene Fibres by Computational Resolution of WAXS.- Real Structure of Crystalline Materials.- Problems in Diffraction Analysis of Real Polycrystals.- Texture Investigation of Natural Rock-Salt by Neutron Diffraction.- Texture and Structure of Anisotropic FeSi Materials after Hot Rolling.- Real Structure of Gd3Co Single Crystals.- HighTemperature Elastic Diffuse Neutron Scattering Study of the Defect Structure in TiN0.82.- X-ray Diffraction Studies of Interdiffusion in Solid Solutions of Semiconductors AIIIBV.- Polycrystal Thin Layers.- Kinematic Theory of X-ray and Neutron Scattering by Defects in Thin Films and Surface Layers.- Methodical Aspects of X-ray Diffraction Analysis of Surface Treated Materials.- Structure Investigation of Hard Coatings by Total Pattern Analysis.- The Determination of Lattice Parameters and Strains in Stressed Thin Films Using X-ray Diffraction: Extensions.- Use and Perspective of X-ray Diffraction in Science and Technology of Ceramic Coatings.- Application of X-ray Diffraction Techniques to Study Highly Dispersed Supported Metals.- Effective Depth of X-ray Penetration and its Orientation Dependence.- Structure of Laser Modified Surface Layers of AlZn Alloys.- Structure Characterization of Laser Treated WC-Co by Means of Position Sensitive Detectors.- Diffraction Studies of SnOX Thin Films Prepared by Vacuum Methods.- X-ray Diffractional Investigation of the Copper-Aluminium Interface Reaction.- X-ray Examination of (PbTe)1-x (GeTe)x Crystals.- Single Crystal Thin Layers.- Structural Studies of Garnet Films.- Location of Impurity Atoms in the Volume and Surface Layers of Silicon Crystals by X-ray Standing Wave in the Laue Geometry.- X-ray Standing Waves in the Study of Crystals and Surface Layers.- Development of Theoretical and Experimental Investigations of Thin Surface Structures by X-ray Methods.- Crystal Structure Determination.- New Trends in Determination of Crystal Structure.- Easy and Uneasy Superspace Groups for Incommensurate Crystals.- Structure Analysis of Modulated Molecular Crystals IV: Survey of our Recent Studies.- Controlled Growth of Polytypes and their Importance for Science and Technology.- Symmetry and Diffraction Patterns of Polytypes.- Structural Characteristics of Polytypes Delivered by Texture Diffraction Patterns.- The X-ray Method for Determining Crystalline Multilayer Polytype Structures in Metal Alloys.- The Analysis of Disorder Polytype Structures by Statistical Parameters.- Data Acquisition.- Bragg Reflection Analysis for Powdered Samples.- Rietveld Refinement of Y2O3 — Comparison of Two Profile Functions.- Three-Dimensional Multiple X-ray Diffraction.- Reduction of the Electronics of a ID Position Sensitive Detector.- A High Resolution Monochromator Module with X-ray Optics for Multipurpose Measurement of A3B5 Heterostructures.- List of Authors.- Abbreviations.