Electron Microscopy – Principles and Fundamentals

Presents a survey of the physical fundamentals and principles of modern techniques of electron microscopy. This reference work contains topics including Stationary Beam Methods: Transmission Electron Microscopy, Electron Energy Loss Spectroscopy, Convergent Electron Beam Diffraction, and Low Energy Electron Microscopy.

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Derived from the successful three-volume "Handbook of Microscopy", this book provides a broad survey of the physical fundamentals and principles of all modern techniques of electron microscopy. This reference work on the method most often used for the characterization of surfaces offers a competent comparison of the feasibilities of the latest developments in this field of research.The topics include: Stationary Beam Methods: Transmission Electron Microscopy, Electron Energy Loss Spectroscopy, Convergent Electron Beam Diffraction, Low Energy Electron Microscopy, Electron Holographic Methods Scanning Beam Methods: Scanning Transmission Electron Microscopy, Scanning Auger and XPS Microscopy, Scanning Microanalysis, Imaging Secondary Ion Mass Spectrometry Magnetic Microscopy: Scanning Electron Microscopy with Polarization Analysis, and, Spin Polarized Low Energy Electron Microscopy. Materials scientists as well as any surface scientist will find this book an invaluable source of information for the principles of electron microscopy.