Atomic Force Microscopy/Scanning Tunneling Microscopy 2
Kluwer Academic/Plenum Publishers (Verlag)
978-0-306-45596-4 (ISBN)
KEYNOTE ADDRESS: Scanned Probe Microscopy.- Semiconductor Characterization and Adsorbate Characterization.- Scanning Tunneling Microscopy for Very Large-Scale Integration (VLSI) Inspection.- Scanning Tunneling Microscopy-Based Fabrication of Nanometer Scale Structures.- A Microscopy for Our Time.- Scanning Tunneling Microscopy of Chemical Vapor Deposition Diamond Film Growth on Highly Oriented Pyrolytic Graphite and Silicon.- Scanning Tunneling Microscopy and Atomic Force Microscopy of Chemical-Vapor-Deposition Diamond and Diamond-Like Carbon Thin Films.- Atomic Resolution Ultrahigh Vacuum Scanning Tunneling Microscopy of Diamond (100) Epitaxial Films.- Scanning Force Microscopy Characterization of Biopolymer Films: Gelatin on Mica.- Gasification Studies of Graphite Surface by Scanning Tunneling Microscopy.- Scanning Tunneling Microscopy Studies of Hydrocarbons Adsorbed on Graphite Surfaces.- Biological and Chemical Nanostructure.- Visualization of the Surface Degradation of Biomedical Polymers in Situ with an Atomic Force Microscope.- Scanning Tunneling Microscopy Investigations on Heteroepitaxially Grown Overlayers of Cu-phthalocyanine On Au(111) Surfaces.- Characterization of Poly(tetrafluoroethylene) Surfaces by Atomic Force Microscopy—Results and Artifacts.- Scanning Probe Microscopy Studies of Isocyanide Functionalized Polyaniline Thin Films.- New Developments in AFM/STM.- Investigations on the Topographic and Spectroscopic Imaging by the Scanning Tunneling Microscope.- Observing Reactions via Flow Injection Scanning Tunneling Microscopy.- Advances in Piezoresistive Cantilevers for Atomic Force Microscopy.- Nanometer-Scale Qualitative Analysis of Surfaces with a Modified Scanning Tunneling Microscope/Field Emission Source.- Atomic Force Microscopy Imaging ofSingle Ion Impacts on Mica.- AFM/STM in Materials Science.- Applications of Atomic Force Microscopy in Optical Fiber Research.- Atomic Force Microscopy Studies on Optical Fibers.- Scanning Tunneling Microscopy Studies of Solvent-Deposited Materials on Highly Oriented Pyrolytic Graphite.- In Situ Study of Stainless Steel’s Passive Layer Exposed to HC1 Using a Scanning Tunneling Microscope.- Application of Magnetic Force Microscopy in Magnetic Recording.- Scanning Electron Microscopy, Scanning Tunneling Microscopy, and Atomic Force Microscopy Studies of Selected Videotapes.- Surface Characteristics Evaluation of Thin Films byAtomic Force Microscopy.- Current versus Voltage Characteristics for Deposition and Removal of Gold Nanostructures on a Gold Surface Using Scanning Tunneling Microscopy.- Atomic Force Microscopy of Ion-Beam Modified Carbon Fibers.
Erscheint lt. Verlag | 30.4.1997 |
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Zusatzinfo | X, 250 p. |
Verlagsort | New York |
Sprache | englisch |
Maße | 178 x 254 mm |
Themenwelt | Naturwissenschaften |
Technik ► Maschinenbau | |
ISBN-10 | 0-306-45596-X / 030645596X |
ISBN-13 | 978-0-306-45596-4 / 9780306455964 |
Zustand | Neuware |
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