Advances in X-Ray Analysis -  Conference on Applications of X-Ray Analysis

Advances in X-Ray Analysis

Volume 23
Buch | Hardcover
390 Seiten
1980
Kluwer Academic/Plenum Publishers (Verlag)
978-0-306-40435-1 (ISBN)
119,99 inkl. MwSt
Traditionally the emphasis at each annual Denver X-ray Con­ ference is placed on a particular aspect of X-ray analysis. It is evident that portable X-ray analyzers are finding more and more applications outside the conventional boundaries of X-ray spectrometry.
Traditionally the emphasis at each annual Denver X-ray Con­ ference is placed on a particular aspect of X-ray analysis. The past decade has seen a steady expansion of applications of port­ able X-ray analyzers and probes in the field, in boreholes and in plant process streams. With this in mind, the main theme of the current conference is field applications of X-ray fluorescence with particular reference to analysis of raw materials such as rocks, ores and coal. The Plenary Session took up this theme with two invited papers reviewing applications of X-ray emission techniques to geochemical, borehole and on-stream analysis, and recent developments in port­ able instruments for alloy, ore and other analyses. The third paper took us further afield with a review of X-ray spectrochemical analy­ sis on Mars, the Moon and Earth. It is evident that portable X-ray analyzers are finding more and more applications outside the conventional boundaries of X-ray spectrometry. Users are not analysts and sometimes not even scien­ tists. Until recently this trend has been hindered by the "scien­ tific nature" of the instruments; one needs to understand XRF meth­ ods in order to properly operate the instrument. Microprocessor technology has made possible the development of precalibrated, "smart" analyzers with readouts in quantities familiar to the user and interlocks to prevent erroneous operation. Further developments along these lines were reported at this conference.

XRF Applications in the Minerals Industry.- Some Applications of Energy Dispersive X-Ray Fluorescence Analysis in Minerals Exploration, Mining and Process Control.- Analysis of Magnesium Brines by Energy Dispersive XRF.- Portable X-Ray Fluorescence Analyzers and Their Use in an Underground Exploration Program for Tin.- Applications of a New Multielement Portable X-Ray Spectrometer to Materials Analysis.- In Situ Rock Analysis.- Rapid Determination of Ash in Coal By Compton Scattering, Ca And Fe X-Ray Fluorescence.- On Site Determination of Ash in Coal Utilizing a Portable XRF Analyzer.- Routine Energy Dispersive Analysis of Sulfur in Coal.- Application of the Fundamental Parameters Model to Energy-Dispersive X-Ray Fluorescence Analysis of Complex Silicates.- Elemental Analysis of Uraniferous Rocks and Ores By X-Ray Spectrometry.- The Fast Analysis of Uranium Ore by EDXRF.- Mathematical Methods in XRF.- A Comprehensive Alpha Coefficient Algorithm.- Fundamental-Parameters Calculations on a Laboratory Microcomputer.- Modified NRLXRF Program for Energy Dispersive X-Ray Fluorescence Analysis.- Unusual Matrix Fluorescence Effects in X-Ray Fluorescence Analysis.- Monte Carlo Simulation of Sample Scattering Effects from Homogeneous Samples Excited by Monoenergetic Photons.- The Application of Digital Filters to the Analysis of Ge And Si (Li) Detector X-Ray Spectra.- XRF Applications in Environmental Analysis.- X-Ray Spectrometric Determination of Sulfate in Natural Waters.- Application of the Pixe Method in Atmospheric Aerosol Investigations.- Computer Code for Analyzing X-Ray Fluorescence Spectra of Airborne Particulate Matter.- Other XRF Applications.- Energy Dispersive X-Ray Fluorescence (EDXRF) Analysis As A Reliable Nondestructive Industrial Tool.- Nondestructive, Energy-Dispersive, X-Ray Fluorescence Analysis Of Actinide Stream Concentrations from Reprocessed Nuclear Fuel.- Direct Determination of Niobium in Uranium-Niobium Alloys.- In Vivo X-Ray Fluorescence Analysis for Medical Diagnosis.- Effect of Chemical State Upon Phosphorus-L2,3 Fluorescence Spectra.- X-Ray Study of the Band Structure in Stannic Oxide.- Energy Dispersive XRF Composition Profiling Using Crystal Collimated Incident Radiation.- Energy Dispersive X-Ray Fluorescence Analysis of Inks on Paper.- Determination of the Thickness of Si02-Layers on Si by X-Ray Analysis and by X-Ray Photoelectron Spectroscopy..- XRF: Techniques and Instrumentation.- The Effective Use of Filters with Direct Excitation of EDXRF.- A Plasma Controlled X-Ray Tube.- X-Ray Fluorescence Analysis at Room Temperature with an Energy Dispersive Mercuric Iodide Spectrometer.- New Mold Design for Casting Fused Samples.- X-Ray Imaging.- Use of Computers in Powder Diffraction.- The Search-Match Problem.- A Computer Aided Search/Match System for Qualitative Powder Diffractometry.- A Second Derivative Algorithm for Identification of Peaks in Powder Diffraction Patterns.- Advances in the Computer Indexing of Powder Patterns.- Specplot—An Interactive Data Reduction and Display Program for Spectral Data.- A Minicomputer and Methodology for X-Ray Analysis.- X-Ray Diffraction Stress (Strain) Determination.- Fracture Surface Analysis of Ball Bearing Steel By X-Ray Residual Stress Measurement.- A Position-Sensitive Proportional Counter for Residual Stress Measurement by Means of Microbeam X-Rays.- Stress Analysts in Graphite/Epoxy.- Problems Associated with K? Doublet in Residual Stress Measurements.- Inclination of Principal Residual Stress and the Direction of Cracking in Contact-Fatigued Ball Bearing Steel.-X-Ray Diffraction in Materials Analysis.- The Generalization and Refinement of the Vector Method for the Texture Analysis of Polycrystalline Baterials.- The Fitting of Powder Diffraction Profiles to an Analytical Expression and the Influence of Line Broadening Factors.- Quantitative Phase Analysis of Synthetic Silicon Nitride by X-Ray Diffraction.- Author Index.

Zusatzinfo XVIII, 390 p.
Sprache englisch
Themenwelt Naturwissenschaften Chemie Analytische Chemie
Naturwissenschaften Physik / Astronomie Allgemeines / Lexika
ISBN-10 0-306-40435-4 / 0306404354
ISBN-13 978-0-306-40435-1 / 9780306404351
Zustand Neuware
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von Friedrich W. Küster; Alfred Thiel; Andreas Seubert

Buch | Softcover (2023)
De Gruyter (Verlag)
54,95