Physical Principles of Electron Microscopy

An Introduction to TEM, SEM, and AEM

(Autor)

Buch | Hardcover
202 Seiten
2005 | 1st ed. 2005. Corr. printing 2005
Springer-Verlag New York Inc.
978-0-387-25800-3 (ISBN)

Lese- und Medienproben

Physical Principles of Electron Microscopy - R.F. Egerton
171,19 inkl. MwSt
Scanning and stationary-beam electron microscopes have become an indespensible tool for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology and the biological, forensic, and medical sciences. This book provides an introduction to the theory and current practice of electron microscopy, aimed primarily at undergraduates who need to learn how the basic principles of physics are applied in an important area of science and technology that has contributed greatly to our knowledge of life processes and "inner space." However, it will be equally valuable for technologists who make use of electron microscopes and for graduate students, university teachers and researchers who need a concise text that deals with the basic principles of microscopy. Less technical but broader in scope than other microscopy textbooks, Physical Principles of Electron Microscopy is appropriate for undergraduates and technologists with limited mathematical training.

An Introduction to Microscopy.- Electron Optics.- The Transmission Electron Microscope.- TEM Specimens and Images.- The Scanning Electron Microscope.- Analytical Electron Microscopy.- Recent Developments.

Erscheint lt. Verlag 11.2.2011
Zusatzinfo 122 Illustrations, black and white; XII, 202 p. 122 illus.
Verlagsort New York, NY
Sprache englisch
Maße 155 x 235 mm
Themenwelt Naturwissenschaften Physik / Astronomie Angewandte Physik
Technik Maschinenbau
ISBN-10 0-387-25800-0 / 0387258000
ISBN-13 978-0-387-25800-3 / 9780387258003
Zustand Neuware
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